Detection Systems for Neutron Radiography

2009 ◽  
pp. 35-35-23 ◽  
Author(s):  
H Berger
Keyword(s):  
Neutron Radiography ◽  
Detection Systems

scholarly journals Development of a Neutron Imaging Station at the n_TOF Facility of CERN and Applications to Beam Intercepting Devices

Instruments ◽  
2019 ◽  
Vol 3 (2) ◽  
pp. 32 ◽  
Author(s):  
Federica Mingrone ◽  
Marco Calviani ◽  
Claudio Torregrosa Martin ◽  
Oliver Aberle ◽  
Michael Bacak ◽  
...  
Keyword(s):  
Neutron Beam ◽  
Neutron Radiography ◽  
Beam Line ◽  
Neutron Imaging ◽  
Experimental Results ◽  
Detection Systems ◽  
Experimental Area ◽  
Shortest Distance ◽  
Antiproton Production ◽  
Imaging Setup

A neutron radiography testing station has been developed exploiting the neutron beam of CERN’s n_TOF Experimental Area 2, located at the shortest distance to the neutron producing-target. The characteristics of the n_TOF neutron beam for the imaging setup are presented in this paper, together with the obtained experimental results. The results focused on the testing of several particle producing targets, including a spent antiproton production targets as well as targets from two different HiRadMat’s experiments. The possible developments of neutron imaging capabilities of the n_TOF facility in terms of detection-systems and beam-line upgrades are as well outlined.

The Potentials of Scanning Microscopy

1968 ◽  
Vol 26 ◽  
pp. 352-353
Author(s):  
A. V. Crewe
Keyword(s):  
Salient Feature ◽  
Secondary Emission ◽  
Resolving Power ◽  
X Rays ◽  
Scanning Microscope ◽  
Forming Process ◽  
Additional Tool ◽  
Detection Systems ◽  
Conventional Microscope ◽  
Present Information

If the resolving power of a scanning electron microscope can be improved until it is comparable to that of a conventional microscope, it would serve as a valuable additional tool in many investigations.The salient feature of scanning microscopes is that the image-forming process takes place before the electrons strike the specimen. This means that several different detection systems can be employed in order to present information about the specimen. In our own particular work we have concentrated on the use of energy loss information in the beam which is transmitted through the specimen, but there are also numerous other possibilities (such as secondary emission, generation of X-rays, and cathode luminescence).Another difference between the pictures one would obtain from the scanning microscope and those obtained from a conventional microscope is that the diffraction phenomena are totally different. The only diffraction phenomena which would be seen in the scanning microscope are those which exist in the beam itself, and not those produced by the specimen.

Universal ESEM

1993 ◽  
Vol 51 ◽  
pp. 786-787
Author(s):  
G.D. Danilatos
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Vacuum ◽  
Natural Extension ◽  
Necessary Condition ◽  
Environmental Scanning ◽  
Detection Systems ◽  
Small Gain ◽  
Detection Medium ◽  
Scanning Electron

The environmental scanning electron microscope (ESEM) has evolved as the natural extension of the scanning electron microscope (SEM), both historically and technologically. ESEM allows the introduction of a gaseous environment in the specimen chamber, whereas SEM operates in vacuum. One of the detection systems in ESEM, namely, the gaseous detection device (GDD) is based on the presence of gas as a detection medium. This might be interpreted as a necessary condition for the ESEM to remain operational and, hence, one might have to change instruments for operation at low or high vacuum. Initially, we may maintain the presence of a conventional secondary electron (E-T) detector in a "stand-by" position to switch on when the vacuum becomes satisfactory for its operation. However, the "rough" or "low vacuum" range of pressure may still be considered as inaccessible by both the GDD and the E-T detector, because the former has presumably very small gain and the latter still breaks down.

A microfluidic device with integrated impedance detection for λ-DNA

2003 ◽  
Vol 773 ◽  
Author(s):  
Myung-Il Park ◽  
Jonging Hong ◽  
Dae Sung Yoon ◽  
Chong-Ook Park ◽  
Geunbae Im
Keyword(s):  
Microfluidic Device ◽  
Electrochemical Impedance ◽  
Direct Detection ◽  
Full Potential ◽  
Label Free ◽  
Buffer Solution ◽  
Detection Systems ◽  
Significant Difference ◽  
Detection Of Biomolecules ◽  
Impedance Magnitude

AbstractThe large optical detection systems that are typically utilized at present may not be able to reach their full potential as portable analysis tools. Accurate, early, and fast diagnosis for many diseases requires the direct detection of biomolecules such as DNA, proteins, and cells. In this research, a glass microchip with integrated microelectrodes has been fabricated, and the performance of electrochemical impedance detection was investigated for the biomolecules. We have used label-free λ-DNA as a sample biomolecule. By changing the distance between microelectrodes, the significant difference between DW and the TE buffer solution is obtained from the impedance-frequency measurements. In addition, the comparison for the impedance magnitude of DW, the TE buffer, and λ-DNA at the same distance was analyzed.

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