Effect of Fatigue-Induced Defects on the Residual Response of Composite Laminates

2008 ◽  
pp. 194-194-23 ◽  
Author(s):  
AL Highsmith ◽  
WW Stinchcomb ◽  
KL Reifsnider
Keyword(s):  
Composite Laminates ◽  
Residual Response ◽  
Induced Defects

Void reduction in VARTM composites by compaction of dry fiber preforms with stationary and moving magnets

2018 ◽  
Vol 53 (6) ◽  
pp. 769-782 ◽  
Author(s):  
Mehrad Amirkhosravi ◽  
Maya Pishvar ◽  
M Cengiz Altan
Keyword(s):  
Composite Laminates ◽  
Volume Fraction ◽  
Compaction Pressure ◽  
Void Content ◽  
Novel Method ◽  
Improved Performance ◽  
Small Parts ◽  
Induced Defects ◽  
Fiber Preforms

Voids are the most common process-induced defects in composite laminates fabricated by vacuum assisted resin transfer molding (VARTM). Reduction or total elimination of these defects is essential for the improved performance and long-term durability of the structural composites. This study introduces a novel method that reduces the void content in VARTM laminates to below 1% by compacting the fibrous mat before infusion. The compaction is achieved by applying magnetic pressure on the vacuum bag by either stationary or moving magnets which are removed before the resin infusion. To assess the effectiveness of the proposed method, 6-, 12-, and 18-ply random mat glass/epoxy laminates are fabricated by VARTM using compacted and uncompacted mats and their properties are compared. In addition, different sets of magnets are used to investigate the effect of compaction levels on the resin flow and the quality of the final part. The placement of stationary magnets on the entire vacuum bag surface is practical for fabrication of small parts. For medium to large parts, however, magnets with a smaller footprint can be moved to apply the compaction pressure over a larger vacuum bag surface. The results show that by applying compaction pressure of 0.2 MPa or higher either by stationary or moving magnets on the dry preforms, the void volume fraction was decreased by 65%–95% to 0.1%–0.8% in all laminates.

Micro-CT analysis of process-induced defects in composite laminates using AFP

2021 ◽  
pp. 1-10
Author(s):  
Ji-Youn Arns ◽  
Ebrahim Oromiehie ◽  
Christoph Arns ◽  
B. Gangadhara Prusty
Keyword(s):  
Composite Laminates ◽  
Micro Ct ◽  
Ct Analysis ◽  
Induced Defects

Quantitative defect studies in semiconductor TEM samples prepared by low angle ion milling

1995 ◽  
Vol 53 ◽  
pp. 512-513
Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf
Keyword(s):  
Sample Preparation ◽  
Milling Time ◽  
High Density ◽  
Low Density ◽  
Ion Milling ◽  
High Quality ◽  
Variable Angle ◽  
Major Disadvantage ◽  
Induced Defects

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).

Xenon ion irradiation of superconducting YBa2Cu3O7 thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 92-93
Author(s):  
H. Watanabe ◽  
B. Kabius ◽  
B. Roas ◽  
K. Urban
Keyword(s):  
Defect Formation ◽  
Ion Irradiation ◽  
High Resolution Electron Microscopy ◽  
Structural Disorder ◽  
Flux Lines ◽  
Pinning Effect ◽  
Magnetic Flux Lines ◽  
Resolution Electron ◽  
Radiation Induced ◽  
Induced Defects

Recently it was reported that the critical current density(Jc) of YBa2Cu2O7, in the presence of magnetic field, is enhanced by ion irradiation. The enhancement is thought to be due to the pinning of the magnetic flux lines by radiation-induced defects or by structural disorder. The aim of the present study was to understand the fundamental mechanisms of the defect formation in association with the pinning effect in YBa2Cu3O7 by means of high-resolution electron microscopy(HRTEM).The YBa2Cu3O7 specimens were prepared by laser ablation in an insitu process. During deposition, a substrate temperature and oxygen atmosphere were kept at about 1073 K and 0.4 mbar, respectively. In this way high quality epitaxially films can be obtained with the caxis parallel to the <100 > SrTiO3 substrate normal. The specimens were irradiated at a temperature of 77 K with 173 MeV Xe ions up to a dose of 3.0 × 1016 m−2.

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