Compositional Analysis of Light-Duty Motor Bearings in Fuel Pumps

2009 ◽  
pp. 85-85-13
Author(s):  
NA Pamphilis
Keyword(s):  
Compositional Analysis ◽  
Light Duty

Compositional Analysis of III-V Interface Lattice Images

1980 ◽  
Vol 38 ◽  
pp. 318-319
Author(s):  
A. Olsen ◽  
J.C.H. Spence ◽  
P. Petroff
Keyword(s):  
Crystal Structure ◽  
Image Matching ◽  
Compositional Analysis ◽  
Depth Of Field ◽  
Limit Set ◽  
High Contrast ◽  
Resolution Limit ◽  
Fourier Image ◽  
Lattice Images ◽  
True Structure

Since the point resolution of the JEOL 200CX electron microscope is up = 2.6Å it is not possible to obtain a true structure image of any of the III-V or elemental semiconductors with this machine. Since the information resolution limit set by electronic instability (1) u0 = (2/πλΔ)½ = 1.4Å for Δ = 50Å, it is however possible to obtain, by choice of focus and thickness, clear lattice images both resembling (see figure 2(b)), and not resembling, the true crystal structure (see (2) for an example of a Fourier image which is structurally incorrect). The crucial difficulty in using the information between Up and u0 is the fractional accuracy with which Af and Cs must be determined, and these accuracies Δff/4Δf = (2λu2Δf)-1 and ΔCS/CS = (λ3u4Cs)-1 (for a π/4 phase change, Δff the Fourier image period) are strongly dependent on spatial frequency u. Note that ΔCs(up)/Cs ≈ 10%, independent of CS and λ. Note also that the number n of identical high contrast spurious Fourier images within the depth of field Δz = (αu)-1 (α beam divergence) decreases with increasing high voltage, since n = 2Δz/Δff = θ/α = λu/α (θ the scattering angle). Thus image matching becomes easier in semiconductors at higher voltage because there are fewer high contrast identical images in any focal series.

High Spatial Resolution Compositional Analysis at Interfaces

1980 ◽  
Vol 38 ◽  
pp. 356-359
Author(s):  
John B. Vander Sande ◽  
Thomas F. Kelly ◽  
Douglas Imeson
Keyword(s):  
Electron Microscope ◽  
High Spatial Resolution ◽  
Compositional Analysis ◽  
Scanning Transmission Electron Microscope ◽  
Thin Specimen ◽  
X Ray ◽  
Volume Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Energy Loss

In the scanning transmission electron microscope (STEM) a fine probe of electrons is scanned across the thin specimen, or the probe is stationarily placed on a volume of interest, and various products of the electron-specimen interaction are then collected and used for image formation or microanalysis. The microanalysis modes usually employed in STEM include, but are not restricted to, energy dispersive X-ray analysis, electron energy loss spectroscopy, and microdiffraction.

Compositional Analysis and Development of Jam, Jelly and Squash from Strawberry Cultivated in Bangladesh

2015 ◽  
Vol 7 (1) ◽  
pp. 271-276
Author(s):  
MA Zubair ◽  
MA Haque ◽  
MM Sultana ◽  
S Akter
Keyword(s):  
Compositional Analysis

16th February 2015. Due to a number of missing tables and figures, this article (DOI: http://dx.doi.org/10.3329/jesnr.v7i1.22182) was withdrawn from Vol.7(1) and has been republished with corrections in Vol.7(2) pp.185-190 (DOI: http://dx.doi.org/10.3329/jesnr.v7i2.22230). The Editor  

Isolation and characterization of cell walls from the mesocarp of mature grape berries (Vitis vinifera)

2020 ◽  
Author(s):  
KJ Nunan ◽  
Ian Sims ◽  
A Bacic ◽  
SP Robinson ◽  
GB Fincher
Keyword(s):  
Vitis Vinifera ◽  
Cell Walls ◽  
Vascular Tissue ◽  
Compositional Analysis ◽  
Water Soluble ◽  
Vitis Vinifera L ◽  
Nylon Mesh ◽  
Cytoplasmic Material ◽  
Isolation And Characterization ◽  
Tissue Homogenates

Cell walls have been isolated from the mesocarp of mature grape (Vitis vinifera L.) berries. Tissue homogenates were suspended in 80% (v/v) ethanol to minimise the loss of water-soluble wall components and wet-sieved on nylon mesh to remove cytoplasmic material. The cell wall fragments retained on the sieve were subsequently treated with buffered phenol at pH 7.0, to inactivate any wall-bound enzymes and to dislodge small amounts of cytoplasmic proteins that adhered to the walls. Finally, the wall preparation was washed with chloroform/methanol (1:1, v/v) to remove lipids and dried by solvent exchange. Scanning electron microscopy showed that the wall preparation was essentially free of vascular tissue and adventitious protein of cytoplasmic origin. Compositional analysis showed that the walls consisted of approximately 90% by weight of polysaccharide and less than 10% protein. The protein component of the walls was shown to be rich in arginine and hydroxyproline residues. Cellulose and polygalacturonans were the major constituents, and each accounted for 30-40% by weight of the polysaccharide component of the walls. Substantial varietal differences were observed in the relative abundance of these two polysaccharides. Xyloglucans constituted approximately 10% of the polysaccharide fraction and the remainder was made up of smaller amounts of mannans, heteroxylans, arabinans and galactans.

AISI 1141

Alloy Digest ◽  
1983 ◽  
Vol 32 (3) ◽  
Keyword(s):  
Carbon Steel ◽  
Transverse Direction ◽  
Longitudinal Direction ◽  
Heat Treating ◽  
Automatic Machine ◽  
Steel Mills ◽  
Light Duty ◽  
High Production ◽  
Ball Joints ◽  
Machining Characteristics

Abstract AISI 1141 is a resulfurized carbon steel containing nominally 1.50% manganese and 0.08-0.13% sulfur to give it free-machining characteristics. It has relatively low hardenability. Its ductility and toughness are fairly good in the longitudinal direction but tend to be low in the transverse direction. It is highly recommended for high-production automatic-machine products. Among its many uses are screws, bolts, ball joints, spindles and light-duty gears. This datasheet provides information on composition, physical properties, hardness, and tensile properties. It also includes information on forming, heat treating, machining, joining, and surface treatment. Filing Code: CS-93. Producer or source: Carbon steel mills.

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