Application of a Thermal Fatigue Life Prediction Model to High-Temperature Aerospace Alloys B1900 + Hf and Haynes 188

Author(s):  
GR Halford ◽  
JF Saltsman ◽  
MJ Verrilli ◽  
V Arya
Author(s):  
T. E. Wong ◽  
C. Chu

A thermal fatigue life prediction model of a ceramic column grid array (CCGA) solder joint assembly has been developed when the 90Pb/10Sn solder columns of the CCGA package are soldered onto the printed circuit board with either tin-lead or lead-free solder paste. This model was evolved from an empirically derived formula by correlating the solder nonelastic strain energy density increment to the fatigue life test data. To develop the solder joint fatigue life prediction model, a nonlinear finite element analysis (FEA) was conducted using the ABAQUS computer code. A thermal fatigue life prediction model was then established. The test results, obtained from various sources in which tin-lead and lead-free solder pastes on PCB were used, combined with the FEA derived nonelastic strain energy density per temperature cycle, ΔW, were used to calibrate the proposed life prediction model. In the analysis, 3-D finite element global- and sub-modeling techniques were used to determine the ΔW of the CCGA solder joints when subjected to temperature cycling. The analysis results show that: 1) solder joint would typically fail across solder column instead of along solder pad interfaces; and 2) higher nonelastic strain energy densities of solder occur at the solder columns at the package corners and these solder joints would fail first. These analysis predictions are consistent with the test observations. In the model calibration process, the 625- and 1657-pin CCGA test results, which were cycled between 20°C/90°C, 0°C/100°C, -55°C/110°C, or -55°C/125°C, were reasonably well correlated to the predicted values of ΔW. Therefore, the developed life prediction model could be used and is recommended to serve as an effective tool to determine the integrity of the CCGA solder joints during temperature cycling. In addition, the following future work is recommended: 1) selecting more study cases with various solder joint configurations, package sizes, environmental profiles, etc. to further calibrate this life prediction model; 2) using this model to conduct parametric studies to identify critical factors impacting solder joint fatigue life and then seek an optimum design; and 3) developing a simplified method instead of the FEA approach to make preliminary thermal fatigue life estimates of the CCGA solder joints.


2016 ◽  
Vol 853 ◽  
pp. 67-71
Author(s):  
Yu Han ◽  
Ke Sheng Wang

With the purpose of long-cycle safe operation of cold stretched austenitic stainless steel pressure vessels so as to achieve unification of economy and safety, prediction of fatigue life of S31603 austenitic stainless steel at high temperature is systematic studied. Based on the Hull-Rimmer cavity theory, a fatigue life prediction model applicable to stress controlled is developed. Fatigue test is carried out on the solution annealed and cold stretched S31603 steel at high temperature and corresponding test data is obtained. The fatigue life of the solution annealed and cold stretched materials is predicted by the model and the prediction results are in good agreement with the experimental results. On this basis, the life prediction model coupled with the strain level of cold stretching is further established. Compared with the test data, the prediction results is found to be very satisfactory with an error band less than ±1.5 times. The fatigue life prediction model suitable for stress control at high temperature is simple in form and has a clear and obvious physical significance which points out a new way to predict fatigue life of metal materials.


Author(s):  
T. E. Wong ◽  
C. Chu

A simplified method was developed to determine the fatigue life of a ceramic column grid array (CCGA) solder joint when exposed to thermal environments. The CCGA package with 90Pb/10Sn solder columns is soldered onto the printed circuit board with a tin-lead solder paste. Failure of the solder joint occurs at the CCGA solder column. A closed-form solution with the equilibrium of displacements of electronic package assembly was first derived to calculate the solder joint strains during the temperature cycling. In the calculation, an iteration technique was used to obtain a convergent solution in the solder strains, and the elastic material properties were used for all the electronic package assembly components except for the solder materials, which used elastic-plastic properties. A fatigue life prediction model, evolved from an empirically derived formula based upon a modified Coffin-Manson fatigue theory, was then established. CCGA test results, obtained from various sources, combined with the derived solder strains were used to calibrate the proposed life prediction model. In the model calibration process, the 625- and 1657-pin CCGA test results, which were cycled between 20°C/90°C, 0°C/100°C, −55°C/110°C, or −55°C/125°C, were reasonably well correlated to the calculated values of solder strains. In addition, this calibrated model is remarkably simple compared to the model used in an evaluation by a finite element analysis. Therefore, this model could be used and is recommended to serve as an effective tool to make a preliminarily estimate at the CCGA solder joint thermal fatigue life. It is also recommended to 1) select more study cases with various solder joint configurations, package sizes, environmental profiles, etc. to further calibrate this life prediction model, 2) use this model to conduct parametric studies to identify critical factors impacting solder joint fatigue life and then seeking an optimum design, and 3) develop a similar life prediction model for lead-free solder materials.


Author(s):  
T. E. Wong ◽  
C. Y. Lau ◽  
H. S. Fenger

A simple analysis method was developed to determine the fatigue life of a ceramic ball grid array (CBGA) solder joint when exposed to thermal environments. The solder joint consists of a 90Pb/10Sn solder ball with eutectic solder on both top and bottom of the ball. Failure of the solder joint occurs at the eutectic solder. A closed-form solution with the equilibrium of displacements of electronic package assembly was first developed to calculate the solder joint strains during the temperature cycling. In the calculation, an iteration technique was used to obtain a convergent solution in the solder strains, and the elastic material properties were used for all the electronic package assembly components except for the solder materials, which used elastic-plastic properties. A fatigue life prediction model, evolved from an empirically derived formula based upon a modified Coffin-Manson fatigue theory, was then established. CBGA test results, obtained from Motorola, combined with the derived solder strains were used to calibrate the proposed life prediction model. In the model calibration process, the 255- and 304-pin CBGA test results, which were cycled between 0°C and 100°C or −40°C and 125°C, were reasonably well correlated to the calculated values of solder strains. In addition, this calibrated model is remarkably simple compared to the model used in an evaluation by finite element analysis. Therefore, this model could be used and is recommended to serve as an effective tool to preliminarily estimate the CBGA solder joint thermal fatigue life.


Author(s):  
Yu Han ◽  
Kesheng Wang

With the purpose of long-cycle safe operation of cold stretched austenitic stainless steel pressure vessels to achieve unification of economy and safety, prediction of fatigue life of S31603 austenitic stainless steel at high temperature is systematic studied. Based on the Hull-Rimmer cavity theory, a fatigue life prediction model applicable to stress controlled is developed. Fatigue tests were carried out on the solution annealed and cold stretched S31603 steel at high temperature and corresponding test data is obtained. The fatigue life of the solution annealed and cold stretched materials was predicted by the model and the prediction results are in good agreement with the experimental lives. On this basis, the life prediction model coupled with the strain level of cold stretching is further established. Compared with the test data, the prediction results is found to be very satisfactory with an error band less than ±1.5 times. The fatigue life prediction model suitable for stress control at high temperature is simple in form and has a clear and obvious physical significance which points out a new way to predict fatigue life of metal materials.


1999 ◽  
Vol 121 (3) ◽  
pp. 186-190 ◽  
Author(s):  
T. E. Wong ◽  
L. A. Kachatorian ◽  
H. M. Cohen

A thermal fatigue life prediction model of J-lead solder joint assembly has been developed. This model is evolved from an empirically derived formula based on modified Manson-Coffin fatigue life Prediction theory. To estimate solder joint fatigue life, nonlinear finite element analysis (FEA) was conducted using the ABAQUS™ computer code. The analysis results show that cracks are initiated and propagated from both the heel and the toe of the solder joint toward the center portion of the joint. This condition results in the solder joint fatigue life degradation and is included in the model development. The fatigue life prediction model is then calibrated to life cycling test results, which were provided by Jet Propulsion Laboratory (JPL/NASA). The developed life prediction model, combined with the nonelastic strains derived from FEA and Miner’s cumulative damage law, was used to predict the cumulative damage index of the solder joint under NASA’s thermal cycling environment (between −55°C and 100°C). The analysis results indicate that this solder joint has a 50 percent failure probability when the solder joint is exposed up to 5206 thermal cycles. To shorten the test time, a modified thermal cycling profile was proposed. This profile is the same as the NASA thermal cycling environment except using the high end of the dwell temperature at 125°C. The analysis results show that a 50 percent failure probability of the solder joint would occur after the solder joint is exposed to 3500 cycles of the NASA thermal environment and followed by 1063 cycles of the modified thermal profile. In conclusion, the developed life prediction model is recommended to serve as an effective tool to integrate the process of design selection, quality inspection, and qualification testing in a concurrent engineering process. It is also recommended to conduct a micro-section in the solder joint to verify the solder crack paths and further validate the life prediction model. When additional thermal cycles have been added into the test specimens, recalibrating this model by test is also recommended.


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