Data Interpretation Issues in Automated Mechanical Testing

2009 ◽  
pp. 51-51-14
Author(s):  
RN Khan
Keyword(s):  
Mechanical Testing ◽  
Data Interpretation

scholarly journals X-ray computed tomography investigation of structures in Opalinus Clay from large-scale to small-scale after mechanical testing

Solid Earth ◽  
2016 ◽  
Vol 7 (4) ◽  
pp. 1171-1183 ◽  
Author(s):  
Annette Kaufhold ◽  
Matthias Halisch ◽  
Gerhard Zacher ◽  
Stephan Kaufhold
Keyword(s):  
Computed Tomography ◽  
Mechanical Testing ◽  
Large Scale ◽  
Data Interpretation ◽  
Radioactive Waste Disposal ◽  
Opalinus Clay ◽  
Small Scale ◽  
X Ray ◽  
Scale Down ◽  
X Ray Computed

Abstract. In the past years X-ray computed tomography (CT) has became more and more common for geoscientific applications and is used from the µm-scale (e.g. for investigations of microfossils or pore-scale structures) up to the dm-scale (full drill cores or soil columns). In this paper we present results from CT imaging and mineralogical investigations of an Opalinus Clay core on different scales and different regions of interest, emphasizing especially the 3-D evaluation and distribution of cracks and their impact on mechanical testing of such material. Enhanced knowledge of the testing behaviour of the Opalinus Clay is of great interest, especially since this material is considered for a long-term radioactive waste disposal and storage facility in Switzerland. Hence, results are compared regarding the mineral (i.e. phase) contrast resolution, the spatial resolution, and the overall scanning speed.With this extensive interdisciplinary scale-down approach it has been possible to characterize the general fracture propagation in comparison to mineralogical and textural features of the Opalinus Clay. Additionally, and as far as we know, a so-called mylonitic zone, located at an intersect of two main fractures, has been observed for the first time for an experimentally deformed Opalinus sample. The multi-scale results are in good accordance to data from naturally deformed Opalinus Clay samples, which enables us to perform systematical research under controlled laboratory conditions. Accompanying 3-D imaging greatly enhances the capability of data interpretation and assessment of such a material.

scholarly journals X-ray Computed Tomography Investigation of Structures in Opalinus Clay from Large Scale to Small Scale after Mechanical Testing

2016 ◽  
Author(s):  
Annette Kaufhold ◽  
Gerhard Zacher ◽  
Matthias Halisch ◽  
Stephan Kaufhold
Keyword(s):  
Computed Tomography ◽  
Mechanical Testing ◽  
Large Scale ◽  
Scanning Speed ◽  
Data Interpretation ◽  
Radioactive Waste Disposal ◽  
Opalinus Clay ◽  
Small Scale ◽  
X Ray ◽  
X Ray Computed

Abstract. In the past years X-ray Computed Tomography (CT) has became more and more common for geoscientific applications and is used from the µm-scale (e.g. for investigations of micro-fossils or pore scale structures) up to the dm-scale (full drill cores or soil columns). In this paper we present results from CT imaging and mineralogical investigations of an Opalinus Clay core on different scales and different regions of interest, emphasizing especially upon the 3D evaluation and distribution of cracks and their impact upon mechanical testing of such material. Enhanced knowledge of the testing behavior of the Opalinus Clay is of great interest, especially since this material is considered for a long term radioactive waste disposal and storage facility in Switzerland. Hence, results are compared regarding the mineral (i.e. phase) contrast resolution, the spatial resolution, and the overall scanning speed. With this extensive interdisciplinary top-down approach it has been possible to characterize the general fracture propagation in comparison to mineralogical and textural features of the Opalinus Clay. Additionally, and as far as we know, a so called mylonitic zone, located at the intersect of two main fractures, has been observed for the first time for an experimentally deformed Opalinus sample. The multi-scale results are in good accordance to data from naturally deformed Opalinus Clay samples, which enables to perform systematical research under controlled laboratory conditions. Accompanying 3D imaging greatly enhances the capability of data interpretation and assessment of such a material.

High Resolution Microscopy of Multi-Layered Biological Crystals

1982 ◽  
Vol 40 ◽  
pp. 80-83
Author(s):  
H.A. Cohen ◽  
T.W. Jeng ◽  
W. Chiu
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Three Dimensional ◽  
Data Interpretation ◽  
Two Dimensional ◽  
Biological Objects ◽  
Density Maps ◽  
Density Map ◽  
Complex Crystal ◽  
High Resolution Microscopy

This tutorial will discuss the methodology of low dose electron diffraction and imaging of crystalline biological objects, the problems of data interpretation for two-dimensional projected density maps of glucose embedded protein crystals, the factors to be considered in combining tilt data from three-dimensional crystals, and finally, the prospects of achieving a high resolution three-dimensional density map of a biological crystal. This methodology will be illustrated using two proteins under investigation in our laboratory, the T4 DNA helix destabilizing protein gp32*I and the crotoxin complex crystal.

GPR data interpretation by the deep learning with coloring data

2019 ◽  
Vol 72 (0) ◽  
pp. 68-77
Author(s):  
Shinichiro Iso ◽  
Kazuya Ishitsuka ◽  
Kyosuke Onishi ◽  
Toshifumi Matsuoka
Keyword(s):  
Deep Learning ◽  
Data Interpretation

Development of Backside Scanning Capacitance Microscopy Technique for Advanced SOI Microprocessors

2006 ◽  
Author(s):  
Vinod Narang ◽  
P. Muthu ◽  
J.M. Chin ◽  
Vanissa Lim
Keyword(s):  
Plasma Etching ◽  
Data Interpretation ◽  
Parameters Optimization ◽  
Scanning Capacitance Microscopy ◽  
Microscopy Technique ◽  
Thermal Oxide ◽  
Specific Analysis ◽  
Thin Oxide ◽  
P Type ◽  
Uv Ozone

Abstract Implant related issues are hard to detect with conventional techniques for advanced devices manufactured with deep sub-micron technology. This has led to introduction of site-specific analysis techniques. This paper presents the scanning capacitance microscopy (SCM) technique developed from backside of SOI devices for packaged products. The challenge from backside method includes sample preparation methodology to obtain a thin oxide layer of high quality, SCM parameters optimization and data interpretation. Optimization of plasma etching of buried oxide followed by a new method of growing thin oxide using UV/ozone is also presented. This oxidation method overcomes the limitations imposed due to packaged unit not being able to heat to high temperature for growing thermal oxide. Backside SCM successfully profiled both the n and p type dopants in both cache and core transistors.

Auto-Metrology on TEM Images of FinFET

2014 ◽  
Author(s):  
Sajal Biring
Keyword(s):  
Data Analysis ◽  
Data Interpretation ◽  
Visual Judgment ◽  
Manual Measurement ◽  
Size And Shape ◽  
Highly Sensitive ◽  
Edge Detecting ◽  
Geometrical Data ◽  
Precision And Accuracy ◽  
Device Size

Abstract The FinFET has been introduced in the last decade to provide better transistor performance as the device size shrinks. The performance of FinFET is highly sensitive to the size and shape of the fin, which needs to be optimized with tighter control. Manual measurement of nano-scale features on TEM images of FinFET is not only a time consuming and tedious task, but also prone to error owing to visual judgment. Here, an auto-metrology approach is presented to extract the measured values with higher precision and accuracy so that the uncertainty in the manual measurement can be minimized. Firstly, a FinFET TEM image is processed through an edge detecting algorithm to reveal the fin profile precisely. Finally, an algorithm is utilized to calculate out the required geometrical data relevant to the FinFET parameters and summarizes them to a table or plots a graph based on the purpose of data interpretation. This auto-metrology approach is expected to be adopted by academia and/or industry for proper data analysis and interpretation with higher precision and efficiency.

Sign in / Sign up

Export Citation Format

Share Document