Optical Measurement of Biaxial Strain in Thin Film Polymers

2009 ◽  
pp. 123-123-15
Author(s):  
JL Rand ◽  
DA Grant
Keyword(s):  
Thin Film ◽  
Optical Measurement ◽  
Biaxial Strain

Temperature dependence of biaxial strain and its influence on phonon and band gap of GaN thin film

2008 ◽  
Vol 17 (6) ◽  
pp. 2245-2250 ◽  
Author(s):  
Xu Hong-Yan ◽  
Jian Ao-Qun ◽  
Xue Chen-Yang ◽  
Chen Yang ◽  
Zhang Bin-Zhen ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Band Gap ◽  
Biaxial Strain

Appling of New Optical Measurement and Theory in Mechanical Properties of Thin Film

2011 ◽  
Vol 121-126 ◽  
pp. 4295-4299
Author(s):  
Hao MA Yun ◽  
Lu Ping Chao ◽  
J. S Hsu
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Properties ◽  
Thermal Stresses ◽  
Optical Measurement ◽  
Phase Shifting ◽  
Deposition Condition ◽  
Full Field ◽  
Evaporation Technique ◽  
Film Substrate

The thesis aims to characterize the mechanical properties and stresses for thin films deposited on the circular substrates. First, the thin films with the same deposition condition were successively deposited on the distinct substrates using the evaporation technique. The phase-shifting Twyman-Green interferometer (PSTGI) was then employed to measure the warpage of the film-substrate structures and therefore the intrinsic stresses and thermal stresses can be calculated from the well-known Stoney’s formula. The coefficients of thermal expansion (CTE) and Young’s modulus of thin films were also obtained from the Stoney’s theory. Furthermore, the merit of full-field character of optical interferometry was used to propose a novel methodology using the Chen and Ou’s theory to improve the accuracy and to reduce the experiment procedures in the traditional measurement of the aforementioned mechanical properties. Finally, the measured results corresponding to the traditional and proposed methods were respectively substituted into their adopted theories to compare their difference. The results reveal that the accuracy of proposed methodology is considerably improved and the experimental procedures are reduced to those of the traditional methods.

Rapid Fabrication of ZnS Thin Film and Microsphere by Microwave-Assisted Chemical Solution Method

2012 ◽  
Vol 455-456 ◽  
pp. 711-715
Author(s):  
Jian Min Li ◽  
Long Long Zhang ◽  
Ling Yu Li ◽  
Hai Yan Xu
Keyword(s):  
Thin Film ◽  
Solution Method ◽  
Optical Measurement ◽  
Chemical Solution ◽  
Time Saving ◽  
Rapid Preparation ◽  
Force Microscopy ◽  
Microwave Assisted ◽  
Chemical Solution Method ◽  
Atomic Force

A rapid preparation route, microwave-assisted chemical solution method, has been developed for the fabrication of zinc sulfide (ZnS) thin film and powder with shape of microsphere. The as-obtained products were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and optical measurement. XRD results indicated that the structures of as-obtained products are wurtzite. The SEM and AFM photographs show that uniform ZnS microsphere with size of less than 1 μm and homogeneous thin film could be obtained from solution under adequate conditions with thiourea as sulfide source. The results show that microwave-assisted chemical solution method is really a time saving method to fabricate the ZnS thin film and nanostructured microspheres.

REALIZATION AND CHARACTERIZATION OF A NEW ORGANIC THIN FILM SEMICONDUCTOR

2019 ◽  
Vol 26 (01) ◽  
pp. 1850127 ◽  
Author(s):  
IMANE TIFFOUR ◽  
SALAH BASSAID ◽  
ABDELKADER DEHBI ◽  
ABDELKADER BELFEDAL ◽  
ABDEL-HAMID I. MOURAD ◽  
...  
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Optical Measurement ◽  
Semiconductor Material ◽  
Index Formula ◽  
Organic Thin Film ◽  
Optical Analysis ◽  
Dispersion Energy ◽  
Optical Energy Bandgap

The main objective of this paper is the realization and characterization of a new organic thin film semiconductor material through the use of an ideal mixture of Acetaminophen/Curcumin utilizing several characterization techniques. From optical analysis, we can conclude that our semiconductor material is comparable and shows good concurrency to the semiconductors applied in technologic applications. In fact, the analysis of the optical measurement (transmittance [Formula: see text] conducting to the optical energy bandgap, [Formula: see text], it was found the optical bandgap is around to [Formula: see text][Formula: see text]eV. In addition, by using the Wemple Didominico model it was found the dispersion energy ED varied from 5[Formula: see text]eV to 7[Formula: see text]eV, the average bandgap [Formula: see text] separated the center of both bands occupied and unoccupied is around 4.5[Formula: see text]eV and the static refractive index [Formula: see text] varies from 1.3 to 2 and it dependent on the compactness and transparency of the material.

Magneto optical measurement of interactions in thin-film media

1992 ◽  
Vol 28 (5) ◽  
pp. 3111-3113
Author(s):  
M. Alex ◽  
C. Gudeman ◽  
D. Peter
Keyword(s):  
Thin Film ◽  
Optical Measurement
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