Interface Strength Evaluation of LSI Devices Using the Weibull Stress

2008 ◽  
pp. 123-123-10
Author(s):  
F Minami ◽  
W Takahara ◽  
T Nakamura
Keyword(s):  
Interface Strength ◽  
Strength Evaluation ◽  
Weibull Stress

Interface Strength Evaluation of LSI Devices Using the Weibull Stress

2004 ◽  
Vol 1 (1) ◽  
pp. 10624
Author(s):  
F Minami ◽  
W Takahara ◽  
T Nakamura
Keyword(s):  
Interface Strength ◽  
Strength Evaluation ◽  
Weibull Stress

Local Interface Strength Evaluation for LSI Interconnect with Micron Resolution

2011 ◽  
Author(s):  
N. Shishido ◽  
C. Chen ◽  
H. Sato ◽  
S. Kamiya ◽  
M. Nishida ◽  
...  
Keyword(s):  
Interface Strength ◽  
Strength Evaluation
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