Application of X-Ray Diffraction Analysis for Determining Residual Stresses on Soil Particles Due to Thermal Treatment

2014 ◽  
Vol 42 (5) ◽  
pp. 20130071 ◽  
Author(s):  
Srinivas Kadali ◽  
D. N. Singh ◽  
S. K. Shekhawat
Keyword(s):  
Thermal Treatment ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Soil Particles ◽  
X Ray

scholarly journals X-ray diffraction analysis of the structure and residual stresses of W/Cu multilayers

2006 ◽  
Vol 201 (7) ◽  
pp. 4372-4376 ◽  
Author(s):  
B. Girault ◽  
P. Villain ◽  
E. Le Bourhis ◽  
P. Goudeau ◽  
P.-O. Renault
Keyword(s):  
Residual Stresses ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray

Neutron and X-Ray Diffraction Analysis of Residual Stresses in Cold-Rolled Pearlitic Steel Sheet

2006 ◽  
pp. 375-380
Author(s):  
Marc Seefeldt ◽  
Artur Walentek ◽  
Paul Van Houtte ◽  
Miroslav Vrána ◽  
Petr Lukáš
Keyword(s):  
Residual Stresses ◽  
Diffraction Analysis ◽  
Steel Sheet ◽  
Pearlitic Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cold Rolled

X-Ray Diffraction Analysis of Steel with Oxidised Surface Layer

2016 ◽  
Vol 368 ◽  
pp. 99-102
Author(s):  
Lukáš Zuzánek ◽  
Ondřej Řidký ◽  
Nikolaj Ganev ◽  
Kamil Kolařík
Keyword(s):  
Residual Stress ◽  
Surface Layer ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
Oxide Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrolytic Polishing ◽  
Small Depth

The basic principle of the X-ray diffraction analysis is based on the determination of components of residual stresses. They are determined on the basis of the change in the distance between atomic planes. The method is limited by a relatively small depth in which the X-ray beam penetrates into the analysed materials. For determination of residual stresses in the surface layer the X-ray diffraction and electrolytic polishing has to be combined. The article is deals with the determination of residual stress and real material structure of a laser-welded steel sample with an oxide surface layer. This surface layer is created during the rolling and it prevents the material from its corrosion. Before the X-ray diffraction analysis can be performed, this surface layer has to be removed. This surface layer cannot be removed with the help of electrolytic polishing and, therefore, it has to be removed mechanically. This mechanical procedure creates “technological” residual stress in the surface layer. This additional residual stress is removed by the electrolytic polishing in the depth between 20 and 80 μm. Finally, the real structure and residual stresses can be determined by using the X-ray diffraction techniques.

X-ray diffraction analysis of residual stresses in textured ZnO thin films

2017 ◽  
Vol 395 ◽  
pp. 16-23 ◽  
Author(s):  
E. Dobročka ◽  
P. Novák ◽  
D. Búc ◽  
L. Harmatha ◽  
J. Murín
Keyword(s):  
Thin Films ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
X Ray

X-Ray Diffraction Analysis of Oxide Layers of Zr-Based Alloys

2007 ◽  
Vol 567-568 ◽  
pp. 237-240
Author(s):  
Galina Gosmanová ◽  
Ivo Kraus ◽  
Michal Kolega ◽  
Věra Vrtílková
Keyword(s):  
Residual Stresses ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Transient Conditions ◽  
Oxide Layers ◽  
X Ray ◽  
Corrosion Kinetics ◽  
Short Time ◽  
Kinetics Of ◽  
Tubular Specimens

The results of X-ray diffraction analysis of macroscopic stresses σ and crystallite size D in oxide layers are presented in this contribution. The oxide layers were formed on tubular specimens of Zircaloy 4 and Zr1Nb alloys which were simultaneously oxidized for various times under temperature transient conditions (oxidation in water at 360 °C with a short-time shock in steam at 500 °C). A qualitative relation was outlined between the residual stresses in oxide layers and corrosion kinetics of the alloys under investigation.

Experimental Analysis of Shot Peening on Carburized or Carbonitrided Parts

2011 ◽  
Vol 681 ◽  
pp. 273-277 ◽  
Author(s):  
Pierre Renaud ◽  
Philippe Bristiel ◽  
Laurent Barrallier ◽  
Marc Desvignes ◽  
Regis Kubler
Keyword(s):  
Experimental Study ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
Experimental Analysis ◽  
Shot Peening ◽  
Hardness Measurement ◽  
Optical Observations ◽  
Experimental Investigations ◽  
X Ray Diffraction ◽  
X Ray

This experimental study focuses on the influence of shot peening on parts initially treated by carburizing or carbonitriding. Experimental investigations have been carried out: optical observations of the microstructures, in-depth hardness measurement, X-ray diffraction analysis of residual stresses. A comparison is made between the carburizing anad the carbonitriding treatments.

X-Ray Diffraction Analysis of Residual Stresses in Alumina-Chromium Composites and Comparison with Numerical Simulations

2002 ◽  
Vol 404-407 ◽  
pp. 547-552 ◽  
Author(s):  
G. Geandier ◽  
Patrick Weisbecker ◽  
S. Denis ◽  
Alain Hazotte ◽  
A. Mocellin ◽  
...  
Keyword(s):  
Residual Stresses ◽  
Diffraction Analysis ◽  
Numerical Simulations ◽  
X Ray Diffraction ◽  
X Ray

X-ray diffraction analysis of residual stresses in smooth fined-grain diamond coatings deposited on TA6V alloys

2005 ◽  
Vol 200 (1-4) ◽  
pp. 170-173 ◽  
Author(s):  
P. Goudeau ◽  
L. Vandenbulcke ◽  
C. Met ◽  
M.I. De Barros ◽  
P. AndreAzza ◽  
...  
Keyword(s):  
Residual Stresses ◽  
Diffraction Analysis ◽  
Diamond Coatings ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Residual stresses in additively manufactured AlSi10Mg: Raman spectroscopy and X-ray diffraction analysis

2021 ◽  
Vol 202 ◽  
pp. 109550
Author(s):  
Silvia Marola ◽  
Silvia Bosia ◽  
Alessandro Veltro ◽  
Gianluca Fiore ◽  
Diego Manfredi ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray
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