Characterization of Defects in Graphite Fiber Based Composite Structures Using the Acoustic Impact Technique (AIT)

1993 ◽  
Vol 21 (5) ◽  
pp. 377 ◽  
Author(s):  
DR Petersen ◽  
PK Raju ◽  
JR Patel ◽  
UK Vaidya
2016 ◽  
Vol 140 (2) ◽  
pp. 1429-1438 ◽  
Author(s):  
Robert D. Corsaro ◽  
Frank Giovane ◽  
Jer-Chyi Liou ◽  
Mark J. Burchell ◽  
Michael J. Cole ◽  
...  

2018 ◽  
Vol 5 (5) ◽  
pp. 180082 ◽  
Author(s):  
W. J. R. Christian ◽  
F. A. DiazDelaO ◽  
K. Atherton ◽  
E. A. Patterson

A new method has been developed for creating localized in-plane fibre waviness in composite coupons and used to create a large batch of specimens. This method could be used by manufacturers to experimentally explore the effect of fibre waviness on composite structures both directly and indirectly to develop and validate computational models. The specimens were assessed using ultrasound, digital image correlation and a novel inspection technique capable of measuring residual strain fields. To explore how the defect affects the performance of composite structures, the specimens were then loaded to failure. Predictions of remnant strength were made using a simple ultrasound damage metric and a new residual strain-based damage metric. The predictions made using residual strain measurements were found to be substantially more effective at characterizing ultimate strength than ultrasound measurements. This suggests that residual strains have a significant effect on the failure of laminates containing fibre waviness and that these strains could be incorporated into computational models to improve their ability to simulate the defect.


1984 ◽  
Vol 35 ◽  
Author(s):  
T. Lohner ◽  
G. Mezey ◽  
M. Fried ◽  
L. GhiţA ◽  
C. Ghiţa ◽  
...  

ABSTRACTOne of the applications of high dose ion implantation is to form surface alloys or compound layers. The detailed characterization of such composite structures is of great importance. This paper tries to answer the question: how can we outline, at least, a qualitative picture from the optical properties measured by ellipsometry of high dose Al and Sb implanted silicon. Attempts are done to separate the effect of implanted impurities from the dominant disorder contribution to the measured optical properties. As the ellipsometry does not provide information enough to decide the applicability of optical models therefore methods sensitive to the structure (channeling and TEM) were applied too.


2014 ◽  
Vol 108 ◽  
pp. 295-303 ◽  
Author(s):  
Mariano A. Arbelo ◽  
Richard Degenhardt ◽  
Saullo G.P. Castro ◽  
Rolf Zimmermann

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