A Resistance Wire Transducer for Circumferential Strain Measurement in Triaxial Tests

1995 ◽  
Vol 18 (1) ◽  
pp. 106 ◽  
Author(s):  
HJ Pincus ◽  
P Skopek ◽  
GP Cyre
Keyword(s):  
Strain Measurement ◽  
Circumferential Strain ◽  
Triaxial Tests ◽  
Resistance Wire

New FBG-based Device for Measuring Small and Large Radial Strains in Triaxial Apparatus

2020 ◽  
Author(s):  
Wen-Bo Chen ◽  
Wei-Qiang Feng ◽  
Jian-Hua Yin ◽  
Jie-Qiong Qin
Keyword(s):  
Strain Measurement ◽  
Radial Strain ◽  
Small Deformation ◽  
Working Environment ◽  
Triaxial Tests ◽  
New Device ◽  
Vertical Strain ◽  
Triaxial Apparatus ◽  
Fbg Sensors ◽  
Validation Tests

In triaxial tests, it is of great importance to accurately measure the radial strain of a specimen. However, devices for radial strain measurement are relatively fewer than the ones for vertical strain measurement. In this study, a new measurement device based on fiber Bragg grating (FBG) was developed to determine the small and large radial strains of a soil specimen. The new device includes two yokes and two compass-type mechanisms, which are mounted on diametrically opposite sides of the specimen. Metal strips bonded with FBG sensors were chosen as sensing elements and installed at two ends of two legs of a compass-type mechanism so that the small deformation of the specimen can be amplified by a constant ratio to a more detectable value with a higher signal-noise ratio. Considering the temperature sensitivity of FBG and the real working environment, the new device was carefully calibrated underwater. Validation tests on an intact triaxial specimen demonstrated that the new device can work reliably and accurately under both static and cyclic loadings.

Strain Measurement in Optical Fiber Cable Using Resistance Wire

1981 ◽  
Vol 20 (1) ◽  
pp. 25-30 ◽  
Author(s):  
Yutaka Katsuyama ◽  
Yutaka Mitsunaga ◽  
Yukinori Ishida ◽  
Koushi Ishihara
Keyword(s):  
Optical Fiber ◽  
Strain Measurement ◽  
Resistance Wire ◽  
Optical Fiber Cable

Strain measurement by means of bend contour microscopy

1989 ◽  
Vol 47 ◽  
pp. 210-211
Author(s):  
Philip D. Hren
Keyword(s):  
Strain Measurement ◽  
Large Angle ◽  
Single Crystal Silicon ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Silicon Membrane ◽  
Crystal Silicon ◽  
Contour Pattern ◽  
Convergent Beam ◽  
Low Symmetry

The pattern of bend contours which appear in the TEM image of a bent or curled sample indicates the shape into which the specimen is bent. Several authors have characterized the shape of their bent foils by this method, most recently I. Bolotov, as well as G. Möllenstedt and O. Rang in the early 1950’s. However, the samples they considered were viewed at orientations away from a zone axis, or at zone axes of low symmetry, so that dynamical interactions between the bend contours did not occur. Their calculations were thus based on purely geometric arguments. In this paper bend contours are used to measure deflections of a single-crystal silicon membrane at the (111) zone axis, where there are strong dynamical effects. Features in the bend contour pattern are identified and associated with a particular angle of bending of the membrane by reference to large-angle convergent-beam electron diffraction (LACBED) patterns.

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