Practice for Quality Systems for Conducting In Situ Measurements of Lead Content in Paint or Other Coatings Using Field-Portable X-Ray Fluorescence (XRF) Devices

2016 ◽  
Author(s):  
Keyword(s):  
In Situ Measurements ◽  
Lead Content ◽  
Quality Systems ◽  
X Ray

In Situ Measurements of X-Ray-Induced Silver Diffusion into a Ge30Se70Thin Film

2008 ◽  
Vol 91 (3) ◽  
pp. 760-765 ◽  
Author(s):  
Andriy Kovalskiy ◽  
Alfred C. Miller ◽  
Himanshu Jain ◽  
Maria Mitkova
Keyword(s):  
In Situ Measurements ◽  
X Ray ◽  
Silver Diffusion

In situ measurements of the static liquid holdup in Katapak-SP12TM packed column using X-ray tomography

2007 ◽  
Vol 62 (21) ◽  
pp. 6076-6080 ◽  
Author(s):  
Saı¨d Aferka ◽  
Michel Crine ◽  
Anil K. Saroha ◽  
Dominique Toye ◽  
Pierre Marchot
Keyword(s):  
Packed Column ◽  
In Situ Measurements ◽  
Liquid Holdup ◽  
X Ray

Measurement of lead content of children's teeth in situ by X-ray fluorescence

1977 ◽  
Vol 22 (1) ◽  
pp. 56-63 ◽  
Author(s):  
P Bloch ◽  
G Garavaglia ◽  
G Mitchell ◽  
I M Shapiro
Keyword(s):  
Lead Content ◽  
X Ray

In Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP

2013 ◽  
Vol 753 ◽  
pp. 279-284 ◽  
Author(s):  
Radomír Kužel ◽  
Zdeněk Matěj ◽  
Miloš Janeček
Keyword(s):  
In Situ Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Abnormal Growth ◽  
Angular Pressing ◽  
Dislocation Densities ◽  
Diffraction Patterns ◽  
Number Of Passes ◽  
Thermal Stability Of

X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressing) materials were performed after annealing and by in-situ measurements in XRD high-temperature chamber for samples prepared by different number of passes and number of revolutions, respectively. Main attention was given to Cu and Cu-Zr samples. Significant dependence on number of passes was found for ECAP samples. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care must be given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffraction patterns.

scholarly journals In situ measurements of colloid transport and retention using synchrotron X-ray fluorescence

2006 ◽  
Vol 42 (12) ◽  
Author(s):  
David A. DiCarlo ◽  
Yuniati Zevi ◽  
Annette Dathe ◽  
Shree Giri ◽  
Bin Gao ◽  
...  
Keyword(s):  
In Situ Measurements ◽  
Colloid Transport ◽  
X Ray
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