Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

10.1520/e1217-87r92 ◽

1992 ◽

Author(s):

Keyword(s):

Auger Electron ◽

X Ray ◽

Specimen Area

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Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

10.1520/e1217-11 ◽

2011 ◽

Author(s):

Keyword(s):

Auger Electron ◽

X Ray ◽

Specimen Area

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American society for testing and materials. Standard practice for determination of the specimen area contributing to the detected in X-ray photoelectron spectroscopy and Auger electron spectroscopy (E1217-87)

Surface and Interface Analysis ◽

10.1002/sia.740170615 ◽

1991 ◽

Vol 17 (6) ◽

pp. 391-396

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Standard Practice ◽

X Ray ◽

Specimen Area ◽

American Society

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Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

10.1520/e1217-11r19 ◽

2019 ◽

Author(s):

Keyword(s):

Auger Electron ◽

X Ray ◽

Specimen Area

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Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

10.1520/e1217-05 ◽

2005 ◽

Author(s):

Keyword(s):

Auger Electron ◽

X Ray ◽

Specimen Area

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Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

10.1520/e1217-00 ◽

2000 ◽

Author(s):

Keyword(s):

Auger Electron ◽

X Ray ◽

Specimen Area

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution

10.3403/30124110 ◽

2006 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Lateral Resolution ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Effective attenuation lengths for quantitative determination of surface composition by Auger-electron spectroscopy and X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2017.04.008 ◽

2017 ◽

Vol 218 ◽

pp. 1-12 ◽

Cited By ~ 10

Author(s):

A. Jablonski ◽

C.J. Powell

Keyword(s):

Quantitative Determination ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Composition ◽

X Ray

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424u ◽

2015 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

Download Full-text