Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Mapping Intimacies ◽

10.1520/e0995-04 ◽

2004 ◽

Cited By ~ 1

Author(s):

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Background Subtraction ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

10.1520/e0995-97 ◽

1997 ◽

Author(s):

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Background Subtraction ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

10.1520/e0995-16 ◽

2016 ◽

Author(s):

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Background Subtraction ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

10.1520/e0995-11 ◽

2011 ◽

Author(s):

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Background Subtraction ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

10.1520/e0995 ◽

2008 ◽

Author(s):

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Background Subtraction ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser

10.3403/30124424 ◽

2005 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Resolution Analysis ◽

Surface Chemical Analysis

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Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results

10.3403/30242215 ◽

2011 ◽

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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Study of amorphous and crystallised Fe75B25 by Auger electron spectroscopy and X-ray photoelectron spectroscopy

Applied Surface Science ◽

10.1016/0169-4332(91)90396-2 ◽

1991 ◽

Vol 51 (3-4) ◽

pp. 139-155 ◽

Cited By ~ 19

Author(s):

S.K. Sharma ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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International Standardization of Quantitative Surface Analysis by Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

Shinku ◽

10.3131/jvsj.48.261 ◽

2005 ◽

Vol 48 (4) ◽

pp. 261-264

Author(s):

Shigeo TANUMA

Keyword(s):

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Quantitative Surface Analysis ◽

International Standardization

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Summary of ISO/TC 201 Standard: XXIX. ISO 20903: 2006—Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—methods used to determine peak intensities and information required when reporting results

Surface and Interface Analysis ◽

10.1002/sia.2533 ◽

2007 ◽

Vol 39 (5) ◽

pp. 464-466 ◽

Cited By ~ 7

Author(s):

C. J. Powell

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Chemical ◽

X Ray ◽

Surface Chemical Analysis

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A correlation of Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and Rutherford backscattering spectrometry measurements on sputter‐deposited titanium nitride thin films

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574092 ◽

1986 ◽

Vol 4 (6) ◽

pp. 2463-2469 ◽

Cited By ~ 104

Author(s):

Brad J. Burrow ◽

Alan E. Morgan ◽

Russell C. Ellwanger

Keyword(s):

Thin Films ◽

Titanium Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

X Ray ◽

Sputter Deposited

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