Microstructural characterization of creep in the single crystal superalloy CMSX-4

2017 ◽  
Vol 1 (1) ◽  
pp. 17-21
Author(s):  
Robert Albrecht
2017 ◽  
Vol 266 (3) ◽  
pp. 239-248 ◽  
Author(s):  
B. DUBIEL ◽  
P. INDYKA ◽  
T. MOSKALEWICZ ◽  
A. KRUK ◽  
M. ZUBKO ◽  
...  

2005 ◽  
Vol 46 (8) ◽  
pp. 1760-1763 ◽  
Author(s):  
Aya Suzuki ◽  
Masanori Harada ◽  
Yingna Wu ◽  
Hideyuki Murakami

Author(s):  
M.J. Kim ◽  
M. Catalano ◽  
T.P. Sjoreen ◽  
R.W. Carpenter

High-energy implantation of silicon is of great interest in recent years for microelectronics due to the formation of a buried damage or dopant layer away from the active region of the device. The damage nucleation and growth behavior is known to vary significantly along the ion's track for MeV irradiation. In this paper, a detailed characterization of the damage morphology produced by MeV gold ions for different doses into single crystal Si, as well as the associated annealing behavior, is presented.Single crystal n-type Czochralski silicon {001} wafers were implanted with Au++ ions from doses of 1x1015 to 3x1016 cm-2 at 2-3 MeV. Specimen temperatures for all implantations were 20 or 300°C. A measurement with an infrared pyrometer of the implanted surface indicated a slight temperature rise during ion irradiation. The compositional and damage profiles were determined by Rutherford backscattering/channeling spectroscopy (RBS). Cross-sectional TEM samples for microstructural characterization were prepared by mechanical polishing and ion milling. A Philips 400ST/FEG analytical microscope was used for nanoprobe experiments, at 100 kV. Microstructural investigation was performed using ISI-002B and JEM-2000FX microscopes, at 200 kV.


2013 ◽  
Vol 48 (5) ◽  
pp. 569-574 ◽  
Author(s):  
Xipeng TAN ◽  
Jinlai LIU ◽  
Xiaoping SONG ◽  
Tao JIN ◽  
Xiaofeng SUN ◽  
...  

2005 ◽  
Vol 46 (10) ◽  
pp. 2176-2179 ◽  
Author(s):  
Yingna Wu ◽  
Aya Suzuki ◽  
Hideyuki Murakami ◽  
Seiji Kuroda

Crystals ◽  
2021 ◽  
Vol 11 (11) ◽  
pp. 1399
Author(s):  
Weihao Wan ◽  
Dongling Li ◽  
Qingqing Zhou ◽  
Qiang Zeng ◽  
Xin Xue ◽  
...  

Nickel-based single crystal superalloy blades have excellent high-temperature performance as the hot end part of the aero-engine turbine. The most important strengthening phase in the single crystal blade is the γ’ phase, and its morphology and size distribution directly affect the high temperature performance of the single crystal blade. In this work, scanning electron microscopy (SEM) was used to obtain the microscopic images of the γ’ phase in multiple large continuous fields of view in the transverse sections of single crystal blades, and the quantitative statistical characterization of the γ’ phase was performed by image segmentation method based on deep learning. The 20 μm × 20 μm region was selected from the primary dendrite arm, the secondary dendrite arm, and the interdendrite to statistically analyze the γ’ phases. The statistical results show that the average size of the γ’ phase at the position of the interdendrite is significantly larger than the average size of the γ’ phase at the position of the dendrite; the sizes of the γ’ phase at the primary dendrite arm, the secondary dendrite arm and the interdendrite all obey the normal distribution; about 3.17 × 107 γ’ phases are counted in 20 positions in the 5 transverse sections of the single crystal blade in a total area of 5 mm2, and the size, geometric morphology and area fraction of all γ’ phases are respectively counted. In this work, the quantitative parameters of the γ’ phases at 4 different positions of the section of the single crystal superalloy DD5 blade were compared, the size and area fraction of the γ’ phases at the leading edge and the trailing edge were smaller, and the shape of the γ’ phase of the leading edge and the trailing edge is closer to the cube.


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