CAD-basierter Workflow für den semi-automatischen Entwurf optischer Inspektionssysteme

2017 ◽  
Vol 65 (6) ◽  
Author(s):  
Stephan Irgenfried ◽  
Heinz Wörn ◽  
Stephan Bergmann ◽  
Mahsa Mohammadikaji ◽  
Jürgen Beyerer ◽  
...  
Keyword(s):  
Inspection Planning ◽  
Computer Aided ◽  
Computer Aided Inspection ◽  
Stand Der Technik

ZusammenfassungWährend Computer-assistierte Inspektionsplanung (Computer Aided Inspection Planning, CAIP) für mechanische Inspektionsaufgaben Stand der Technik ist, findet sie im Bereich von Entwurf und Umsetzung von Systemen der industriellen Bildverarbeitung (IBV) noch keine breite Anwendung. Dieser Beitrag stellt ein Konzept und die beispielhafte Implementierung vor, wie durch Anreicherung von STEP-CAD-Daten mit Oberflächeneigenschaften von Bauteilen und der Einbettung von Toleranzangaben die Ausgangsbasis für eine semi-automatische Erstellung und Optimierung von Konfigurationsvorschlägen für Bildverarbeitungssysteme in Interaktion mit einem Systemexperten erreicht wird.

A computer-aided inspection planning system for on-machine measurement — part I: Global inspection planning —

2004 ◽  
Vol 18 (8) ◽  
pp. 1349-1357 ◽  
Author(s):  
Honghee Lee ◽  
Myeong-Woo Cho ◽  
Gil-Sang Yoon ◽  
Jin-Hwa Choi
Keyword(s):  
Planning System ◽  
Inspection Planning ◽  
Computer Aided ◽  
Computer Aided Inspection

Computer-Aided Inspection Planning: A Multisensor High-Level Inspection Planning Strategy

2019 ◽  
Vol 19 (2) ◽  
Author(s):  
Sif Eddine Sadaoui ◽  
Charyar Mehdi-Souzani ◽  
Claire Lartigue
Keyword(s):  
Computer Aided Design ◽  
Main Concern ◽  
Laser Sensor ◽  
Inspection Planning ◽  
Research Attention ◽  
Computer Aided ◽  
Measuring Machine ◽  
High Level ◽  
Computer Aided Inspection ◽  
Touch Probe

Computer-aided inspection planning (CAIP) has gained significant research attention in the last years. So far, most CAIP systems have focused on the use of a touch probe mounted on a coordinate measuring machine (CMM). This article investigates multisensor measurement aiming to perform automatic and efficient inspection plans. High-level inspection planning, which deals with sequencing of measuring operations, is the main concern of inspection planning. This paper presents an automatic approach to generate inspection sequences by combining laser sensor and touch probe, and by giving preference to the measurement using the laser sensor if quality requirements are satisfied. The proposed approach consists of three steps. In the first step, recognition of inspection data from the computer-aided design (CAD) part model is carried out based on the concept of inspection feature (IF), and the extracted information is stored in a database. In the second step, a list of privileged scanner orientations is proposed by analyzing the accessibility of both sensors. In the third step, a sequence of operations is generated iteratively. For a given scanner orientation, the ability of the laser sensor is assessed according to an original process based on fuzzy logic model. If the laser sensor does not meet the ability requirements, touch probe ability is assessed. The proposed approach is implemented and tested on a part defined by its CAD model and specifications.

Knowledge-based inspection planning

1992 ◽  
Vol 6 (3) ◽  
pp. 149-162 ◽  
Author(s):  
Huaming Lee ◽  
Jon Sims Williams ◽  
James Tannock
Keyword(s):  
Planning System ◽  
Automated Inspection ◽  
Inspection Planning ◽  
Knowledge Based ◽  
Computer Aided ◽  
Computer Aided Inspection

Inspection planning is a process of reasoning about inspection activities. As a result, a sequence of inspection actions is formulated, which, when performed, will achieve the desired measurements. In manufacturing, automated inspection technologies, such as Computer-Aided Inspection (CAI) or Co-ordinate Measuring Machines (CMMs), will be facilitated by inspection planning. Inspection planning involves the following four aspects: representation of inspection features; process formalization; modeling of inspection activities; and, finally, plan synthesis. This paper discusses an approach to knowledge-based inspection planning. Accordingly, a prototype inspection planning system has been developed, which is also described in this paper.

A computer-aided inspection planning system for on-machine measurement — Part II: Local inspection planning —

2004 ◽  
Vol 18 (8) ◽  
pp. 1358-1367 ◽  
Author(s):  
Myeong-Woo Cho ◽  
Honghee Lee ◽  
Gil-Sang Yoon ◽  
Jin-Hwa Choi
Keyword(s):  
Planning System ◽  
Inspection Planning ◽  
Computer Aided ◽  
Computer Aided Inspection

Image formation simulation for computer-aided inspection planning of machine vision systems

2017 ◽  
Author(s):  
Stephan Irgenfried ◽  
Stephan Bergmann ◽  
Mahsa Mohammadikaji ◽  
Jürgen Beyerer ◽  
Carsten Dachsbacher ◽  
...  
Keyword(s):  
Machine Vision ◽  
Image Formation ◽  
Inspection Planning ◽  
Vision Systems ◽  
Computer Aided ◽  
Computer Aided Inspection

Study on On-Machine Inspection Technology of Machining Center Based

2010 ◽  
Vol 97-101 ◽  
pp. 4282-4286
Author(s):  
Shi Gang Wang ◽  
Yu Juan Wang ◽  
Yi Li Fu
Keyword(s):  
Good Condition ◽  
Machining Process ◽  
Inspection Planning ◽  
Feature Identification ◽  
Machining Center ◽  
Computer Aided ◽  
Inspection Process ◽  
Cad Cam ◽  
On Line ◽  
Computer Aided Inspection

With the development of digitalized manufacturing (DM), on-machine inspection (OMI) has become the key link of integrated quality system in DM. In DM, The detection and monitoring system chiefly dealing with kinds of parameters in machining process, taking on-line detection, analyzing the process quality information and carrying out corresponding quality assurance, so the quality of product may be assured and DM can be run in good condition. Therefore, the OMI technology of machining center based is researched. The framework of OMI and the hardware structure of special driving card for probe or tool (SDCPT) are described. Computer aided inspection planning (CAIP) is the integration bridge between CAD/CAM and computer aided inspection. A feature-based CAIP system for OMI is proposed to inspect the complicated mechanical parts efficiently during machining or after machining. The CAIP system is designed to produce an inspection process planning directly from CAD model. The prototype CAIP system includes the tolerance feature analysis, accessibility analysis, feature identification, measurement planning, and collision detection. The CAIP system can minimize the number of part setups and probe orientations and the inspection feature sequence.

Feature-based design approach for integrated CAD and computer-aided inspection planning

2014 ◽  
Vol 76 (9-12) ◽  
pp. 2159-2183 ◽  
Author(s):  
Ali Kamrani ◽  
Emad Abouel Nasr ◽  
Abdulrahman Al-Ahmari ◽  
Osama Abdulhameed ◽  
Syed Hammad Mian
Keyword(s):  
Design Approach ◽  
Inspection Planning ◽  
Computer Aided ◽  
Feature Based ◽  
Feature Based Design ◽  
Computer Aided Inspection

Intelligent Inspection Planning and Computer Aided Inspection

1993 ◽  
Vol 207 (2) ◽  
pp. 99-104 ◽  
Author(s):  
J D T Tannock ◽  
H Lee ◽  
D R Cox ◽  
J H Sims Williams
Keyword(s):  
Process Model ◽  
Information Storage ◽  
Planning System ◽  
Shop Floor ◽  
Inspection Planning ◽  
Computer Aided ◽  
University Of Bristol ◽  
The University ◽  
Computer Aided Inspection ◽  
And Control

Quality inspection is the source of vital information for business control and improvement in manufacturing. This paper describes research at the University of Bristol, in collaboration with Rolls-Royce plc, to develop automated inspection planning and computer aided inspection applications. The inspection planning system involves the representation of inspection features and the manufacturing process model, together with an automated planning mechanism driven by rule-based plan reasoning. The shop-floor computer aided inspection workstation uses hand-held instruments interfaced to a computer, and provides flexible, interactive assistance for the dimensional inspection task. Batch and component traceability and control, together with a range of quality information storage and reporting functions, are provided.

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