scholarly journals Inelastic Scattering Cross Section of Si Determined from Angular Dependent Reflection Electron Energy Loss Spectra

2009 ◽  
Vol 15 (3) ◽  
pp. 321-324 ◽  
Author(s):  
H. Jin ◽  
H. Yoshikawa ◽  
H. Iwai ◽  
S. Tanuma ◽  
S. Tougaard
Nanophotonics ◽  
2013 ◽  
Vol 2 (4) ◽  
pp. 241-245 ◽  
Author(s):  
Martin Husnik ◽  
Felix von Cube ◽  
Stephan Irsen ◽  
Stefan Linden ◽  
Jens Niegemann ◽  
...  

AbstractUsing a rather large set of different individual metallic optical antennas, we compare directly measured electron energy-loss spectra with measured quantitative optical extinction and scattering cross-section spectra on the identical antennas. All antenna resonances lie near 1.4 µm wavelength. In contrast to other reports, we find identical resonance positions for electrons and photons to within the experimental errors. We discuss possible artifacts which can lead to seemingly different resonance positions in experiments. Our experimental results agree well with complete numerical calculations of both sorts of spectra.


2021 ◽  
Vol 63 (8) ◽  
pp. 1049
Author(s):  
А.С. Паршин ◽  
Ю.Л. Михлин ◽  
Г.А. Александрова

The reflection electron energy losses spectra, obtained in a wide primary electron energy range of 200 - 3000 eV, are investigated. From these experimental spectra, for each primary electron energy, the spectra of the inelastic scattering cross section of electrons are calculated as the dependence of the product of the inelastic electron mean free path and the differential inelastic scattering cross section of electrons on the electron energy loss. The analysis of the fine structure of the reflection electron energy losses was carried out by decomposing the electron energy losses spectra in the region of energy losses of valence electrons into elementary peaks. A relationship is established between each of their elementary peaks with single and multiple energy losses due to the excitation of bulk and surface plasmons and interband transitions of electrons from the valence band to free states above the Fermi level. The analysis of the obtained results was carried out on the basis of experimental and theoretical literature data on the band structure of  Fe2O3.


Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.


Author(s):  
M. Isaacson

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.


Sign in / Sign up

Export Citation Format

Share Document