Nondestructive Depth Resolved Analysis by using Grazing Exit Fluorescence-Yield X-ray Absorption Spectroscopy

2009 ◽  
Vol 15 (3) ◽  
pp. 295-298 ◽  
Author(s):  
K. Shinoda ◽  
S. Sato ◽  
S. Suzuki ◽  
T. Uruga ◽  
H. Tanida ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Fluorescence Yield ◽  
X Ray ◽  
X Ray Absorption

scholarly journals A zone-plate-based two-color spectrometer for indirect X-ray absorption spectroscopy

2019 ◽  
Vol 26 (4) ◽  
pp. 1266-1271 ◽  
Author(s):  
Florian Döring ◽  
Marcel Risch ◽  
Benedikt Rösner ◽  
Martin Beye ◽  
Philipp Busse ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Fresnel Zone ◽  
Decay Channel ◽  
Chemical Properties ◽  
Fluorescence Yield ◽  
Complex Materials ◽  
X Ray ◽  
Total Fluorescence ◽  
X Ray Absorption

X-ray absorption spectroscopy (XAS) is a powerful element-specific technique that allows the study of structural and chemical properties of matter. Often an indirect method is used to access the X-ray absorption (XA). This work demonstrates a new XAS implementation that is based on off-axis transmission Fresnel zone plates to obtain the XA spectrum of La0.6Sr0.4MnO3 by analysis of three emission lines simultaneously at the detector, namely the O 2p–1s, Mn 3s–2p and Mn 3d–2p transitions. This scheme allows the simultaneous measurement of an integrated total fluorescence yield and the partial fluorescence yields (PFY) of the Mn 3s–2p and Mn 3d–2p transitions when scanning the Mn L-edge. In addition to this, the reduction in O fluorescence provides another measure for absorption often referred to as the inverse partial fluorescence yield (IPFY). Among these different methods to measure XA, the Mn 3s PFY and IPFY deviate the least from the true XA spectra due to the negligible influence of selection rules on the decay channel. Other advantages of this new scheme are the potential to strongly increase the efficiency and throughput compared with similar measurements using conventional gratings and to increase the signal-to-noise of the XA spectra as compared with a photodiode. The ability to record undistorted bulk XA spectra at high flux is crucial for future in situ spectroscopy experiments on complex materials.

A fast energy-dispersive multi-element detector for X-ray absorption spectroscopy

2009 ◽  
Vol 16 (2) ◽  
pp. 293-298 ◽  
Author(s):  
Edmund Welter ◽  
Karsten Hansen ◽  
Christian Reckleben ◽  
Inge Diehl
Keyword(s):  
Fine Structure ◽  
Absorption Spectroscopy ◽  
Energy Resolution ◽  
Integrated Circuit ◽  
Fluorescence Yield ◽  
Silicon Drift Detector ◽  
Excellent Performance ◽  
High Count ◽  
X Ray ◽  
X Ray Absorption

In this paper results are presented from fluorescence-yield X-ray absorption fine-structure spectroscopy measurements with a new seven-cell silicon drift detector (SDD) module. The complete module, including an integrated circuit for the detector readout, was developed and realised at DESY utilizing a monolithic seven-cell SDD. The new detector module is optimized for applications like XAFS which require an energy resolution of ∼250–300 eV (FWHM Mn Kα) at high count rates. Measurements during the commissioning phase proved the excellent performance for this type of application.

scholarly journals Intrinsic deviations in fluorescence yield detected x-ray absorption spectroscopy: the case of the transition metal L2,3edges

2012 ◽  
Vol 24 (45) ◽  
pp. 452201 ◽  
Author(s):  
Reshmi Kurian ◽  
Kristjan Kunnus ◽  
Philippe Wernet ◽  
Sergei M Butorin ◽  
Pieter Glatzel ◽  
...  
Keyword(s):  
Transition Metal ◽  
Absorption Spectroscopy ◽  
Fluorescence Yield ◽  
X Ray ◽  
X Ray Absorption

Characterization of Polymers and Their Surfaces Using Ultra-Soft X-Ray Absorption Spectroscopy

1993 ◽  
Vol 304 ◽  
Author(s):  
Gary E. Mitchell ◽  
Benjamin M. Dekoven ◽  
David R. Speth ◽  
Mark E. Jones ◽  
James J. Curphy ◽  
...  
Keyword(s):  
Molecular Weight ◽  
Film Thickness ◽  
Absorption Spectroscopy ◽  
Film Surface ◽  
Polymeric Materials ◽  
Fluorescence Yield ◽  
X Ray ◽  
Surface Sensitivity ◽  
X Ray Absorption

AbstractIn this paper we illustrate the use of Ultra Soft X-ray Absorption Spectroscopy (USXAS) for the characterization of polymeric materials by highlighting three novel applications of the technique. The surface sensitivity of electron yield (3 nm) and the bulk information available from fluorescence yield USXAS (200 nm) provide unique information on the chemistry of polymer surfaces and interfaces. USXAS is sensitive to both concentration and orientation of functional groups in polymers. The systems highlighted here include the characterization of flame treated model acrylic automotive coatings, ultra-low surface energy crosslinked fluorocarbon films, and spin cast polystyrene films. The chemical and surface sensitivity of the technique are emphasized by the ability of USXAS to detect an increase in the trigonally coordinated carbon at the surface after treatment with a reducing flame. The sensitivity to functional group orientation at the surface is demonstrated by the characterization of the crosslinked flurocarbon polymer films. The results show that the pendant fluoroalkyl moieties of these polymers are strongly oriented perpendicular to the film surface. Spin coated polystyrene films were characterized as a functionv of molecular weight, film thickness and casting solvent. The pendant phenyl groups were found to be preferentially oriented towards the normal to the surface plane, independent of casting solvent, molecular weight, and film thickness

scholarly journals Material/element-dependent fluorescence-yield modes on soft X-ray absorption spectroscopy of cathode materials for Li-ion batteries

AIP Advances ◽  
2016 ◽  
Vol 6 (3) ◽  
pp. 035105 ◽  
Author(s):  
Daisuke Asakura ◽  
Eiji Hosono ◽  
Yusuke Nanba ◽  
Haoshen Zhou ◽  
Jun Okabayashi ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Cathode Materials ◽  
Fluorescence Yield ◽  
Li Ion Batteries ◽  
X Ray ◽  
Material Element ◽  
Li Ion ◽  
X Ray Absorption

scholarly journals SOFT X-RAY ABSORPTION SPECTROSCOPY OF THE MgB2 BORON K EDGE IN AN MgB2/Mg COMPOSITE

2006 ◽  
Vol 20 (19) ◽  
pp. 1207-1216 ◽  
Author(s):  
D. A. FISCHER ◽  
A. R. MOODENBAUGH ◽  
QIANG LI ◽  
G. D. GU ◽  
YIMEI ZHU ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Sample Surface ◽  
Fluorescence Yield ◽  
Full Potential ◽  
Augmented Plane Wave ◽  
X Ray ◽  
Plane Wave Method ◽  
Edge Spectrum ◽  
Linearized Augmented Plane Wave ◽  
X Ray Absorption

Soft X-ray absorption spectroscopy (XAS), using fluorescence yield, was used to study the boron K near edge in MgB 2 superconductor. The sample consists of MgB 2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.

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