Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity Ratios without IMFP Values of Reference Material in The 200 – 5000 eV Energy Range

2008 ◽  
Vol 15 (2) ◽  
pp. 195-199 ◽  
Author(s):  
S. Tanuma ◽  
H. Yoshikawa ◽  
N. Okamoto ◽  
K. Goto
Keyword(s):  
Reference Material ◽  
Energy Range ◽  
Elastic Peak ◽  
Peak Intensity ◽  
Intensity Ratios

Evaluation of the inelastic mean free path (IMFP) of electrons in polyaniline and polyacetylene samples obtained from elastic peak electron spectroscopy (EPES)

Open Physics ◽  
2007 ◽  
Vol 5 (2) ◽  
Author(s):  
György Gergely ◽  
Miklós Menyhard ◽  
Attila Sulyok ◽  
Sándor Gurban ◽  
Beata Lesiak ◽  
...  
Keyword(s):  
Free Path ◽  
Cross Sections ◽  
Electron Spectroscopy ◽  
Surface Composition ◽  
Mean Free Path ◽  
Elastic Peak ◽  
Peak Intensity ◽  
Intensity Ratios ◽  
Scattering Cross Sections ◽  
Inelastic Mean Free Path

AbstractThe inelastic mean free path (IMFP) of electrons was determined experimentally for selected polyaniline and polyacetylene samples with Ag and Ni references using elastic peak electron spectroscopy (EPES). The surface composition was determined by XPS and density by helium pycnometry. The high resolution hemispherical ESA-31 and ADES-400 spectrometers were used for measurements in the energy range E = 0.5–3.0 keV and E =0.4 − 1.6 keV, respectively. The integrated elastic peak intensity ratios for sample and reference were calculated using the Monte Carlo (MC) algorithm based on the electron elastic scattering cross-sections database NIST SRD64 version 3.1 and applying TPP-2M IMFPs for polymers. Surface excitation parameters (SEP) and material parameters (ach) for polymers were determined, using the model of Chen, from comparison of measured and MC calculated elastic peak intensity ratios. These corrections proved to be efficient in decreasing the percentage deviations between the obtained IMFPs and the TPP-2M formula IMFPs. The elastic peak of hydrogen was observed in the EPES spectra of polymers. The experimental contribution of the hydrogen to the total elastic peak was 0.58%, while this value obtained from the MC simulations was 1.98%.

Angular variations in core-level XPS peak intensity ratios from single-crystal solids

1979 ◽  
Vol 89 (1-3) ◽  
pp. 64-75 ◽  
Author(s):  
Stephen Evans ◽  
Elizabeth Raftery ◽  
John M. Thomas
Keyword(s):  
Single Crystal ◽  
Core Level ◽  
Peak Intensity ◽  
Intensity Ratios

Surface composition of alloys derived from elastic peak intensity

2002 ◽  
Vol 507-510 ◽  
pp. 895-899 ◽  
Author(s):  
L. Kövér ◽  
J. Tóth ◽  
D. Varga ◽  
B. Lesiak ◽  
A. Jablonski
Keyword(s):  
Surface Composition ◽  
Elastic Peak ◽  
Peak Intensity

Certification of Standard Reference Material 1976B

2015 ◽  
Vol 30 (3) ◽  
pp. 199-204 ◽  
Author(s):  
David R. Black ◽  
Donald Windover ◽  
Marcus H. Mendenhall ◽  
Albert Henins ◽  
James Filliben ◽  
...  
Keyword(s):  
Reference Material ◽  
Powder Diffraction ◽  
Standard Reference Materials ◽  
Third Generation ◽  
Line Position ◽  
X Ray ◽  
The Third ◽  
Intensity Measurements ◽  
Peak Intensity ◽  
Relative Peak Intensity

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of the performance of X-ray powder diffraction instruments. This report describes SRM 1976b, the third generation of this powder diffraction SRM. SRM 1976b consists of a sintered alumina disc, approximately 25.6 mm in diameter by 2.2 mm in thickness, intended for use in the calibration of X-ray powder diffraction equipment with respect to line position and intensity as a function of 2θ-angle. The sintered form of the SRM eliminates the effect of sample loading procedures on intensity measurements. Certified data include the lattice parameters and relative peak intensity values from 13 lines in the 2θ region between 20° and 145° using CuKα radiation. A NIST-built diffractometer, incorporating many advanced and unique design features was used to make the certification measurements.

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