scholarly journals Interface Induced STM Image at Ultrathin Ag(111) Films on Si(111)√3×√3-B Substrates

2018 ◽  
Vol 61 (10) ◽  
pp. 657-662
Author(s):  
Hiroyuki FUKUMOTO ◽  
Yusaku YOSHIIKE ◽  
Hiroo TAJIRI ◽  
Shirou YAMAZAKI ◽  
Kan NAKATSUJI ◽  
...  
Keyword(s):  
Stm Image

Development of the UHV-STM

1990 ◽  
Vol 48 (1) ◽  
pp. 322-323
Author(s):  
M. Iwatsuki ◽  
S. Kitamura ◽  
A. Mogami
Keyword(s):  
Surface Science ◽  
Real Space ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Great Promise ◽  
Force Microscopy ◽  
Atomic Force ◽  
Stm Image ◽  
Surface Construction ◽  
Very High

Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and others. So, the STM technology holds a great promise for the future.The great advantages of the STM are its high spatial resolution in the lateral and vertical directions on the atomic scale. However, the STM has difficulty in identifying atomic images in a desired area because it uses piezoelectric (PZT) elements as a scanner.On the other hand, the demand to observe specimens under UHV condition has grown, along with the advent of the STM technology. The requirment of UHV-STM is especially very high in to study of surface construction of semiconductors and superconducting materials on the atomic scale. In order to improve the STM image quality by keeping the specimen and tip surfaces clean, we have built a new UHV-STM (JSTM-4000XV) system which is provided with other surface analysis capability.

Effect of Microscopic Tip Electronic State on STM Image of Graphite

1989 ◽  
Vol 58 (7) ◽  
pp. 2238-2241 ◽  
Author(s):  
Katsuyoshi Kobayashi ◽  
Masaru Tsukada
Keyword(s):  
Electronic State ◽  
Stm Image

The bonding geometry of alkylsilanes on gold: Relation to surface pattern development and STM image contrast

2007 ◽  
Vol 601 (9) ◽  
pp. 1937-1943 ◽  
Author(s):  
Yunqing Chen ◽  
Mark M. Banaszak Holl ◽  
Bradford G. Orr
Keyword(s):  
Image Contrast ◽  
Surface Pattern ◽  
Pattern Development ◽  
Stm Image

Combined Spectroscopy and STM Studies of (-Cu-O-) Strings on the Ag(110) Surface

1997 ◽  
Vol 3 (S2) ◽  
pp. 651-652
Author(s):  
Yuji Matsumoto ◽  
Kazuyuki Sakamoto ◽  
Shozo Suto ◽  
K.S. An ◽  
TakayaFujita ◽  
...  
Keyword(s):  
Energy Loss ◽  
Chemical Reaction ◽  
Growth Mechanism ◽  
Reversible Reaction ◽  
Loss Peak ◽  
Leed Pattern ◽  
Electric Structure ◽  
Bond Property ◽  
Stm Image

It has been found that when Cu atoms are deposited on a p(2×l)-O Ag(ll0) surface, a (2×2)p2mg LEED pattern appears. The STM image has proved that zig-zag (-Cu-O-) strings grow along the [110] direction on Ag(ll0) (Fig. I)1, where a chemical reaction of (-Ag-O-) + Cu => (-Cu-O-) + Ag take place. The (-Cu-O-) strings grown on a Ag(l10) surface shows a unique reversible reaction given by an equation of (Cu)6+O2⇄ (-Cu-O-) at 570K. In this paper, we studied the bond property, the growth mechanism and electric structure of the (-Cu-O-) strings on Ag(ll0) by using XPS, HREELS and ARUPS as well as STM.As increasing the deposition of Cu atoms on a p(2×l)-O Ag(l10) surface, the O(ls) peak in the XPS shifted from 528.2 eV to 529.9 eV(Fig. 2a). An energy loss peak at 41meV being assignable to (Ag-O) bond disappeared and a new loss peak concomitantly appeared at 35 meV in the HREELS (Fig. 2b).

Effects of Molecular Geometry on the STM Image Contrast of Methyl- and Bromo-Substituted Alkanes and Alkanols on Graphite

1999 ◽  
Vol 103 (44) ◽  
pp. 9690-9699 ◽  
Author(s):  
Christopher L. Claypool ◽  
Francesco Faglioni ◽  
Adam J. Matzger ◽  
William A. Goddard ◽  
Nathan S. Lewis
Keyword(s):  
Molecular Geometry ◽  
Image Contrast ◽  
Stm Image ◽  
Substituted Alkanes

scholarly journals STM investigations of PTCDA and PTCDI on graphite and MoS2. A systematic study of epitaxy and STM image contrast

1994 ◽  
Vol 93 (3) ◽  
pp. 365-373 ◽  
Author(s):  
C. Ludwig ◽  
B. Gompf ◽  
J. Petersen ◽  
R. Strohmaier ◽  
W. Eisenmenger
Keyword(s):  
Systematic Study ◽  
Image Contrast ◽  
Stm Image

WTe2 surfaces in UHV-STM image formation and analysis of point defect structures

1997 ◽  
Vol 380 (2-3) ◽  
pp. 568-575 ◽  
Author(s):  
J.A.A. Crossley ◽  
C.J. Sofield ◽  
S. Myhra
Keyword(s):  
Point Defect ◽  
Image Formation ◽  
Defect Structures ◽  
Stm Image
Sign in / Sign up

Export Citation Format

Share Document