Analytical and <i>in situ</i> Applications Using Aberration Corrected Scanning Transmission Electron Microscope

Ichiro Ohnishi; Toshihiro Suzuki; Kouji Miyatake; Yu Jimbo; Yorinobu Iwasawa; Masaki Morita; Takeo Sasaki; Hidetaka Sawada; Eiji Okunishi

doi:10.1380/ejssnt.2018.286

Analytical and in situ Applications Using Aberration Corrected Scanning Transmission Electron Microscope

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2018.286 ◽

2018 ◽

Vol 16 (0) ◽

pp. 286-288 ◽

Cited By ~ 2

Author(s):

Ichiro Ohnishi ◽

Toshihiro Suzuki ◽

Kouji Miyatake ◽

Yu Jimbo ◽

Yorinobu Iwasawa ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Correction for Albina et al., Depth sectioning with the aberration-corrected scanning transmission electron microscope

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0609974103 ◽

2006 ◽

Vol 103 (50) ◽

pp. 19212-19212

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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In Situ Synthesis of Nanomaterials Using Environmental Scanning/Transmission Electron Microscope (ESTEM)

Microscopy and Microanalysis ◽

10.1017/s1431927606063914 ◽

2006 ◽

Vol 12 (S02) ◽

pp. 784-785

Author(s):

R Sharma

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

In Situ Synthesis ◽

Environmental Scanning ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Synthesis Of Nanomaterials

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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MATERIALS CHARACTERIZATION IN THE ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPE

Annual Review of Materials Research ◽

10.1146/annurev.matsci.35.102103.090513 ◽

2005 ◽

Vol 35 (1) ◽

pp. 539-569 ◽

Cited By ~ 150

Author(s):

M. Varela ◽

A.R. Lupini ◽

K. van Benthem ◽

A.Y. Borisevich ◽

M.F. Chisholm ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Materials Characterization ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Diffraction patterns of artificial two-dimensional crystals synthesized in situ in an environmental scanning transmission electron microscope

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01555.x ◽

2006 ◽

Vol 221 (3) ◽

pp. 159-163

Author(s):

W. F. VAN DORP ◽

B. VAN SOMEREN ◽

C. W. HAGEN ◽

P. KRUIT ◽

P. A. CROZIER

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Environmental Scanning ◽

Two Dimensional ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Diffraction Patterns

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Direct Imaging of the MoVTeNbO M1 Phase Using An Aberration-Corrected High-Resolution Scanning Transmission Electron Microscope

Angewandte Chemie ◽

10.1002/ange.200705700 ◽

2008 ◽

Vol 120 (15) ◽

pp. 2830-2833 ◽

Cited By ~ 26

Author(s):

William D. Pyrz ◽

Douglas A. Blom ◽

Thomas Vogt ◽

Douglas J. Buttrey

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

M1 Phase ◽

Direct Imaging ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Energy dispersive X-ray spectroscopy of bimetallic nanoparticles in an aberration corrected scanning transmission electron microscope

Faraday Discussions ◽

10.1039/b706293c ◽

2008 ◽

Vol 138 ◽

pp. 337-351 ◽

Cited By ~ 88

Author(s):

Andrew A. Herzing ◽

Masashi Watanabe ◽

Jennifer K. Edwards ◽

Marco Conte ◽

Zi-Rong Tang ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Bimetallic Nanoparticles ◽

Scanning Transmission Electron Microscope ◽

Energy Dispersive ◽

X Ray ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Depth sectioning with the aberration-corrected scanning transmission electron microscope

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0507105103 ◽

2006 ◽

Vol 103 (9) ◽

pp. 3044-3048 ◽

Cited By ~ 157

Author(s):

A. Y. Borisevich ◽

A. R. Lupini ◽

S. J. Pennycook

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope

Microscopy and Microanalysis ◽

10.1017/s1431927615008363 ◽

2015 ◽

Vol 21 (S3) ◽

pp. 1517-1518

Author(s):

Y. Zheng ◽

R. E. A. Williams ◽

H. L. Fraser

Keyword(s):

Titanium Alloy ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Aberration Corrected

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Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron microscope

Ultramicroscopy ◽

10.1016/j.ultramic.2019.112885 ◽

2020 ◽

Vol 209 ◽

pp. 112885

Author(s):

Chenzhi Song ◽

Jianlin Wang ◽

Jianping Sun ◽

Yu Liu ◽

Pan Chen ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Scanning Transmission Electron Microscope ◽

Long Period ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Period Pattern ◽

Insight Into ◽

Aberration Corrected

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Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transmission Electron Microscope (ESTEM) System with an Open Window Gas Injection

Microscopy and Microanalysis ◽

10.1017/s1431927618002088 ◽

2018 ◽

Vol 24 (S1) ◽

pp. 318-319 ◽

Cited By ~ 1

Author(s):

H. Inada ◽

H. Kikuchi ◽

A. Hanawa ◽

Y. Suzuki ◽

M. Shirai ◽

...

Keyword(s):

Electron Microscope ◽

Real Time ◽

Transmission Electron Microscope ◽

Gas Injection ◽

Scanning Transmission Electron Microscope ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Open Window ◽

Aberration Corrected

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