Atomic depth distribution analysis and growth dynamics of metals on metal-covered Si(111) surfaces studied by incident-angle-dependent RHEED-TRAXS (total-reflection-angle x-ray spectroscopy)

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2003.91 ◽

2003 ◽

Vol 1 ◽

pp. 91-101 ◽

Cited By ~ 3

Author(s):

Toshiro Yamanaka

Keyword(s):

Depth Distribution ◽

Incident Angle ◽

Growth Dynamics ◽

Total Reflection ◽

Distribution Analysis ◽

X Ray ◽

Reflection Angle

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A New Method for Atomic Depth Distribution Analysis Using RHEED-Total Reflection Angle X-ray Spectroscopy(TRAXS), and Growth Modes of Thin Films.

Hyomen Kagaku ◽

10.1380/jsssj.15.585 ◽

1994 ◽

Vol 15 (9) ◽

pp. 585-590

Author(s):

Toshiro YAMANAKA ◽

Shozo INO

Keyword(s):

Thin Films ◽

Depth Distribution ◽

Total Reflection ◽

New Method ◽

Distribution Analysis ◽

X Ray ◽

Reflection Angle ◽

Growth Modes

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Atomic depth distribution analysis of Ag and Au on Si(111) during epitaxial growth by total reflection angle X-ray spectroscopy

Surface Science Letters ◽

10.1016/0167-2584(93)91125-8 ◽

1993 ◽

Vol 294 (1-2) ◽

pp. A659

Author(s):

Toshiro Yamanaka ◽

Akira Endo ◽

Shozo Ino

Keyword(s):

Epitaxial Growth ◽

Depth Distribution ◽

Total Reflection ◽

Distribution Analysis ◽

X Ray ◽

Reflection Angle

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Atomic depth distribution analysis of Ag and Au on Si(111) during epitaxial growth by total reflection angle X-ray spectroscopy

Surface Science ◽

10.1016/0039-6028(93)90158-g ◽

1993 ◽

Vol 294 (1-2) ◽

pp. 53-66 ◽

Cited By ~ 42

Author(s):

Toshiro Yamanaka ◽

Akira Endo ◽

Shozo Ino

Keyword(s):

Epitaxial Growth ◽

Depth Distribution ◽

Total Reflection ◽

Distribution Analysis ◽

X Ray ◽

Reflection Angle

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High Sensitivity Detection of a Few Atomic Layers of Adsorbate by RHEED-TRAXS (Total Reflection Angle X-Ray Spectroscopy)

Springer Series in Surface Sciences - The Structure of Surfaces II ◽

10.1007/978-3-642-73343-7_55 ◽

1988 ◽

pp. 334-339 ◽

Cited By ~ 1

Author(s):

S. Ino ◽

S. Hasegawa ◽

H. Matsumoto ◽

H. Daimon

Keyword(s):

High Sensitivity ◽

Total Reflection ◽

X Ray ◽

Reflection Angle ◽

High Sensitivity Detection ◽

Sensitivity Detection

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Measurement of Glancing Incidence-Exit X-ray Scattering in Reflection High Energy Electron Diffraction and Total-Reflection-Angle X-ray Spectroscopy System

Japanese Journal of Applied Physics ◽

10.1143/jjap.35.5553 ◽

1996 ◽

Vol 35 (Part 1, No. 10) ◽

pp. 5553-5557 ◽

Cited By ~ 2

Author(s):

Ziyuan Liu ◽

Seiya Ogota ◽

Tadataka Morishita

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

X Ray Scattering ◽

Reflection Angle ◽

Spectroscopy System ◽

Ray Scattering

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Study of a Si(110) surface by using reflection high-energy electron diffraction-total reflection angle X-ray spectroscopy and high temperature scanning tunneling microscopy

Surface Science ◽

10.1016/0039-6028(94)91163-0 ◽

1994 ◽

Vol 313 (1-2) ◽

pp. 155-167 ◽

Cited By ~ 41

Author(s):

Youiti Yamamoto

Keyword(s):

High Temperature ◽

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Scanning Tunneling ◽

High Energy Electron ◽

Tunneling Microscopy ◽

X Ray ◽

Reflection Angle ◽

Temperature Scanning

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Novel Chemical Analysis for Thin Films: Scanning Electron Microscopy & Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)-X-Ray Take-Off Angle Effect

Japanese Journal of Applied Physics ◽

10.1143/jjap.30.l1689 ◽

1991 ◽

Vol 30 (Part 2, No. 9B) ◽

pp. L1689-L1691

Author(s):

Toshio Usui ◽

Masayuki Kamei ◽

Yuji Aoki ◽

Tadataka Morishita ◽

Shoji Tanaka

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

Chemical Analysis ◽

Total Reflection ◽

X Ray ◽

Reflection Angle ◽

Angle Effect ◽

Scanning Electron

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X-Ray Chemical Analysis of Multilayered Thin Films by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.33.l813 ◽

1994 ◽

Vol 33 (Part 2, No. 6A) ◽

pp. L813-L816 ◽

Cited By ~ 2

Author(s):

Kyoko Yonemitsu ◽

Noriyoshi Shibata

Keyword(s):

Electron Microscopy ◽

Thin Films ◽

Scanning Electron Microscopy ◽

Chemical Analysis ◽

Total Reflection ◽

X Ray ◽

Reflection Angle ◽

Multilayered Thin Films ◽

Scanning Electron

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X-Ray Chemical Analysis of an YBa2Cu3OxThin Film by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)

Japanese Journal of Applied Physics ◽

10.1143/jjap.30.l2032 ◽

1991 ◽

Vol 30 (Part 2, No. 12A) ◽

pp. L2032-L2035 ◽

Cited By ~ 1

Author(s):

Toshio Usui ◽

Yuji Aoki ◽

Masayuki Kamei ◽

Hiromi Takahashi ◽

Tadataka Morishita ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Chemical Analysis ◽

Total Reflection ◽

X Ray ◽

Reflection Angle ◽

Scanning Electron

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Glancing Angle Dependence of the X-Ray Emission Measured under Total Reflection Angle X-Ray Spectroscopy (TRAXS) Condition during Reflection High Energy Electron Diffraction Observation

Japanese Journal of Applied Physics ◽

10.1143/jjap.31.l1503 ◽

1992 ◽

Vol 31 (Part 2, No. 10B) ◽

pp. L1503-L1505 ◽

Cited By ~ 10

Author(s):

Toshiro Yamanaka ◽

Takashi Hanada ◽

Shozo Ino ◽

Hiroshi Daimon

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Total Reflection ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Angle Dependence ◽

Reflection Angle ◽

Glancing Angle

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