White Light Spectral Interferometry as a Spectrometer Calibration Tool

2014 ◽  
Vol 68 (5) ◽  
pp. 525-530 ◽  
Author(s):  
Raúl de la Fuente
Keyword(s):  
White Light ◽  
Spectral Interferometry ◽  
Spectrometer Calibration ◽  
Calibration Tool

Measurement of absolute phase shift on reflection of thin films using white-light spectral interferometry

2009 ◽  
Vol 7 (5) ◽  
pp. 446-448 ◽  
Author(s):  
薛晖 Hui Xue ◽  
沈伟东 Weidong Shen ◽  
顾培夫 Peifu Gu ◽  
罗震岳 Zhenyue Luo ◽  
章岳光 Yueguang Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Shift ◽  
White Light ◽  
Spectral Interferometry ◽  
Absolute Phase

scholarly journals Refractive index measurements in absorbing media with white light spectral interferometry

2018 ◽  
Vol 26 (6) ◽  
pp. 7578 ◽  
Author(s):  
Yago Arosa ◽  
Elena López Lago ◽  
Raúl de la Fuente
Keyword(s):  
Refractive Index ◽  
White Light ◽  
Spectral Interferometry ◽  
Absorbing Media

The phase ambiguity in dispersion measurements by white light spectral interferometry

2017 ◽  
Vol 95 ◽  
pp. 23-28 ◽  
Author(s):  
Yago Arosa ◽  
Elena López Lago ◽  
Raúl de la Fuente
Keyword(s):  
White Light ◽  
Phase Ambiguity ◽  
Spectral Interferometry

scholarly journals Measurement of the group dispersion of the fundamental mode of holey fiber by white-light spectral interferometry

2007 ◽  
Vol 15 (18) ◽  
pp. 11073 ◽  
Author(s):  
P. Hlubina ◽  
M. Szpulak ◽  
D. Ciprian ◽  
T. Martynkien ◽  
W. Urbanczyk
Keyword(s):  
White Light ◽  
Fundamental Mode ◽  
Holey Fiber ◽  
Spectral Interferometry

Measuring small thickness changes of a thin film by white-light spectral interferometry

2009 ◽  
Author(s):  
P. Hlubina ◽  
J. Lunácek ◽  
D. Ciprian ◽  
M. Lunácková
Keyword(s):  
Thin Film ◽  
White Light ◽  
Small Thickness ◽  
Spectral Interferometry
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