Time-Correlated Raman and Fluorescence Spectroscopy Based on a Silicon Photomultiplier and Time-Correlated Single Photon Counting Technique

2013 ◽  
Vol 67 (2) ◽  
pp. 136-140 ◽  
Author(s):  
Chunling Zhang ◽  
Liying Zhang ◽  
Ru Yang ◽  
Kun Liang ◽  
Dejun Han

We report a time-correlated Raman spectroscopy technique based on a silicon photomultiplier (SiPM) and a time-correlated single photon counting (TCSPC) technique to exploit the natural temporal separation between Raman and fluorescence phenomena to alleviate the high fluorescence background with conventional Raman detection. The TCSPC technique employed can greatly reduce the effect of high dark count rate (DCR) and crosstalk of SiPM that seriously hinder its application in low light level detection. The operating principle and performance of the 400 ps time resolution system are discussed along with the improvement of the peak-to-background ratio (PBR) for bulk trinitrotoluene (TNT) Raman spectrum relative to a commercial Raman spectrometer with charge coupled device (CCD). The fluorescence lifetime for solid TNT and Surface Enhanced Raman Scattering (SERS) spectrum for 10−6 mol/L trace TNT have also been obtained by this system, showing excellent versatility and convenience in spectroscopy measurement.

2015 ◽  
Vol 54 (31) ◽  
pp. 9277 ◽  
Author(s):  
Ying Yang ◽  
Jianhong Shi ◽  
Fei Cao ◽  
Jinye Peng ◽  
Guihua Zeng

Author(s):  
Mike Bruce ◽  
Rama R. Goruganthu ◽  
Shawn McBride ◽  
David Bethke ◽  
J.M. Chin

Abstract For time resolved hot carrier emission from the backside, an alternate approach is demonstrated termed single point PICA. The single point approach records time resolved emission from an individual transistor using time-correlated-single-photon counting and an avalanche photo-diode. The avalanche photo-diode has a much higher quantum efficiency than micro-channel plate photo-multiplier tube based imaging cameras typically used in earlier approaches. The basic system is described and demonstrated from the backside on a ring oscillator circuit.


Author(s):  
Maria Concetta Maccarone ◽  
Giovanni La Rosa ◽  
Osvaldo Catalano ◽  
Salvo Giarrusso ◽  
Alberto Segreto ◽  
...  

AbstractUVscope is an instrument, based on a multi-pixel photon detector, developed to support experimental activities for high-energy astrophysics and cosmic ray research. The instrument, working in single photon counting mode, is designed to directly measure light flux in the wavelengths range 300-650 nm. The instrument can be used in a wide field of applications where the knowledge of the nocturnal environmental luminosity is required. Currently, one UVscope instrument is allocated onto the external structure of the ASTRI-Horn Cherenkov telescope devoted to the gamma-ray astronomy at very high energies. Being co-aligned with the ASTRI-Horn camera axis, UVscope can measure the diffuse emission of the night sky background simultaneously with the ASTRI-Horn camera, without any interference with the main telescope data taking procedures. UVscope is properly calibrated and it is used as an independent reference instrument for test and diagnostic of the novel ASTRI-Horn telescope.


Sensors ◽  
2021 ◽  
Vol 21 (16) ◽  
pp. 5287
Author(s):  
Hiwa Mahmoudi ◽  
Michael Hofbauer ◽  
Bernhard Goll ◽  
Horst Zimmermann

Being ready-to-detect over a certain portion of time makes the time-gated single-photon avalanche diode (SPAD) an attractive candidate for low-noise photon-counting applications. A careful SPAD noise and performance characterization, however, is critical to avoid time-consuming experimental optimization and redesign iterations for such applications. Here, we present an extensive empirical study of the breakdown voltage, as well as the dark-count and afterpulsing noise mechanisms for a fully integrated time-gated SPAD detector in 0.35-μm CMOS based on experimental data acquired in a dark condition. An “effective” SPAD breakdown voltage is introduced to enable efficient characterization and modeling of the dark-count and afterpulsing probabilities with respect to the excess bias voltage and the gating duration time. The presented breakdown and noise models will allow for accurate modeling and optimization of SPAD-based detector designs, where the SPAD noise can impose severe trade-offs with speed and sensitivity as is shown via an example.


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