Estimation of Effective Refractive Index of Birefringent Particles Using a Combination of the Immersion Liquid Method and Light Scattering

2008 ◽  
Vol 62 (4) ◽  
pp. 399-401 ◽  
Author(s):  
Ilpo Niskanen ◽  
Jukka Ráty ◽  
Kai-Erik Peiponen
2012 ◽  
Vol 58 (1) ◽  
pp. 46-50 ◽  
Author(s):  
Ilpo Niskanen ◽  
Jorma Heikkinen ◽  
Jukka Mikkonen ◽  
Anni Harju ◽  
Henrik Heräjärvi ◽  
...  

1995 ◽  
Vol 60 (11) ◽  
pp. 1875-1887 ◽  
Author(s):  
Jaroslav Holoubek ◽  
Miroslav Raab

Theoretical background for an optical method is presented which makes it possible to distinguish unambiguously between voids and particles as light scattering sites in polymeric materials. Typical dependences of turbidity as a function of diameter of scattering elements, their volume fractions and also turbidity curves as a function of the wavelength of the incident light were calculated, based both on the Lorenz-Mie theory and the fluctuation theory. Such dependences calculated for polypropylene-containing voids on the one hand and particles, differing only slightly from the surrounding matrix in their refractive index, on the other hand, are markedly different. The most significant results are: (i) Turbidity is at least by two orders of magnitude larger for voids in comparison to embedded particles of ethylene-propylene (EPDM) rubber of the same size, concentration and at the same wavelength. (ii) The wavelength dependence of turbidity for EPDM particles and the inherent refractive index fluctuations in the polypropylene matrix is much steeper as compared to voids for all considered diameters (0.1-10 μm). Thus, the nature of stress whitening in complex polymeric materials can be determined from turbidity measurements.


2007 ◽  
Vol 21 (30) ◽  
pp. 5075-5089 ◽  
Author(s):  
HALA M. KHALIL ◽  
MOHAMMED M. SHABAT ◽  
SOFYAN A. TAYA ◽  
MAZEN M. ABADLA

In this work, we present an extensive theoretical analysis of nonlinear optical waveguide sensor. The waveguide under consideration consists of a thin dielectrica film surrounded by a self-focused nonlinear cladding and a linear substrate. The nonlinearity of the cladding is considered to be of Kerr-type. Both cases, when the effective refractive index is greater and when it is smaller than the index of the guiding layer, are discussed. The sensitivity of the effective refractive index to any change in the cladding index in evanescent optical waveguide sensor is derived for TM modes. Closed form analytical expressions and normalized charts are given to provide the conditions required for the sensor to exhibit its maximum sensitivity. The results are compared with those of the well-known linear evanescent waveguide sensors.


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