Fast structured illumination microscopy via deep learning

2020 ◽  
Vol 8 (8) ◽  
pp. 1350 ◽  
Author(s):  
Chang Ling ◽  
Chonglei Zhang ◽  
Mingqun Wang ◽  
Fanfei Meng ◽  
Luping Du ◽  
...  
2021 ◽  
Author(s):  
ZAFRAN HUSSAIN SHAH ◽  
Marcel Müller ◽  
TUNG-CHENG WANG ◽  
Philip Scheidig ◽  
Axel Schneider ◽  
...  

Author(s):  
Miguel A. Boland ◽  
Edward A. K. Cohen ◽  
Seth R. Flaxman ◽  
Mark A. A. Neil

Structured Illumination Microscopy (SIM) is a widespread methodology to image live and fixed biological structures smaller than the diffraction limits of conventional optical microscopy. Using recent advances in image up-scaling through deep learning models, we demonstrate a method to reconstruct 3D SIM image stacks with twice the axial resolution attainable through conventional SIM reconstructions. We further demonstrate our method is robust to noise and evaluate it against two-point cases and axial gratings. Finally, we discuss potential adaptions of the method to further improve resolution. This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)’.


2020 ◽  
Vol 11 (1) ◽  
Author(s):  
Luhong Jin ◽  
Bei Liu ◽  
Fenqiang Zhao ◽  
Stephen Hahn ◽  
Bowei Dong ◽  
...  

Author(s):  
Nihar Das ◽  
Nisarg Sharma ◽  
Vaishnavi Shebare ◽  
Parth Dawda ◽  
Prajakta Gourkhede ◽  
...  

With the ever-growing field of microscopy there is pretty much a necessity of high - resolution microscopic images. A microscope may have powerful magnifying lenses, but if the resolution is poor, the magnified image is just blur and no useful insights can be gained from such images. Traditional techniques like Structured Illumination Microscopy (SIM) are not feasible enough for proper use and current solutions based on deep learning assume that the input image is noise free. Based on our research and existing applications related to deep learning-based image enhancement, our proposed solution of deep learning based General Adversarial Network (GAN), will help jointly denoise and super-resolved microscopy images. Thus, this project has competitive applications in different research areas including biomedical microscopy, medical diagnosis, astronomical research, surveillance or investigation, etc., and many other areas as well.


Author(s):  
Doron Shterman ◽  
Gilad Feinberg ◽  
Shai Tsesses ◽  
Yochai Blau ◽  
Guy Bartal

Author(s):  
Yongbing Zhang ◽  
Xu Chen ◽  
Bowen Li ◽  
Shaowei Jiang ◽  
Terrance Zhang ◽  
...  

2020 ◽  
Author(s):  
Zafran Hussain Shah ◽  
Marcel Müller ◽  
Tung-Cheng Wang ◽  
Philip Maurice Scheidig ◽  
Axel Schneider ◽  
...  

AbstractSuper-resolution structured illumination microscopy (SR-SIM) provides an up to two-fold enhanced spatial resolution of fluorescently labeled samples. The reconstruction of high quality SR-SIM images critically depends on patterned illumination with high modulation contrast. Noisy raw image data, e.g. as a result of low excitation power or low exposure times, result in reconstruction artifacts. Here, we demonstrate deep-learning based SR-SIM image denoising that results in high quality reconstructed images. A residual encoding-decoding convolution neural network (RED-Net) was used to successfully denoise computationally reconstructed noisy SR-SIM images. We also demonstrate the entirely deep-learning based denoising and reconstruction of raw SIM images into high-resolution SR-SIM images. Both image reconstruction methods prove to be very robust against image reconstruction artifacts and generalize very well over various noise levels. The combination of computational reconstruction and subsequent denoising via RED-Net shows very robust performance during inference after training even if the microscope settings change.


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