scholarly journals Performance improvement of optical RZ-receiver by utilizing an all-optical waveform converter

2005 ◽  
Vol 13 (13) ◽  
pp. 5074 ◽  
Author(s):  
Motoharu Matsuura ◽  
Naoto Kishi ◽  
Tetsuya Miki
Keyword(s):  
Performance Improvement ◽  
All Optical

Performance improvement of long-range surface plasmon structure for use in an all-optical switch

2016 ◽  
Vol 56 (12) ◽  
pp. 121901 ◽  
Author(s):  
Ali Jandaghian ◽  
Ali Lotfalian ◽  
Mohsen Kouhkan ◽  
Ezeddin Mohajerani
Keyword(s):  
Performance Improvement ◽  
Long Range ◽  
Surface Plasmon ◽  
Optical Switch ◽  
All Optical ◽  
All Optical Switch

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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