Investigation into inhomogeneous electrical and optical properties of indium tin oxide film using spectroscopic ellipsometry with multi-layer optical models
1998 ◽
Vol 313-314
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pp. 394-397
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2019 ◽
Vol 30
(9)
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pp. 8508-8514
Keyword(s):
Keyword(s):
1993 ◽
Vol 68
(4)
◽
pp. 497-504
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