Specular reflection of x rays in the anomalous dispersion region of the silicon K absorption edge

1980 ◽  
Vol 5 (12) ◽  
pp. 543 ◽  
Author(s):  
J. M. Andre ◽  
R. Barchewitz
Keyword(s):  
Absorption Edge ◽  
Specular Reflection ◽  
Anomalous Dispersion ◽  
X Rays ◽  
Dispersion Region

Layered structure analysis of GMR multilayers by X-ray reflectometry using the anomalous dispersion effect

1998 ◽  
Vol 5 (3) ◽  
pp. 969-971 ◽  
Author(s):  
Tatsumi Hirano ◽  
Katsuhisa Usami ◽  
Kazuhiro Ueda ◽  
Hiroyuki Hoshiya
Keyword(s):  
Absorption Edge ◽  
Layered Structure ◽  
Anomalous Dispersion ◽  
X Rays ◽  
Dispersion Effect ◽  
Accurate Analysis ◽  
Final Thickness ◽  
X Ray ◽  
Interface Width ◽  
Good Agreement

As a basic layered structure for giant magnetoresistive (GMR) heads, NiFe/Cu/NiFe/Ta/Si substrate was measured by X-ray reflectometry at Cu Kα, Cu Kβ and Cu K-absorption-edge energies. The accuracy of both the Cu thickness and the interface width between the upper NiFe and the Cu layers was found to improve in the order Cu Kα < Cu Kβ < Cu K-edge. The final thickness and interface width values obtained from Cu Kβ reflectivity are in good agreement with those from the Cu K-edge. The anomalous-dispersion effect is useful in the more accurate analysis of the layered structure of transition metal multilayers because it causes a large difference in the refractive indices of specific elements near the absorption edge. The Kβ X-rays, which can be produced from conventional X-ray sources, are also available for the accurate analysis of reflectivity measurements.

X-Ray absorption edge elemental imaging of B. thuringienis

1989 ◽  
Vol 47 ◽  
pp. 212-213
Author(s):  
R. L. Stears
Keyword(s):  
Absorption Edge ◽  
Elemental Distribution ◽  
X Rays ◽  
Differential Absorption ◽  
Synchrotron Source ◽  
High Brightness ◽  
X Ray ◽  
Elemental Imaging ◽  
Cellular Integrity ◽  
X Ray Absorption

Because of the nature of the bacterial endospore, little work has been done on analyzing their elemental distribution and composition in the intact, living, hydrated state. The majority of the qualitative analysis entailed intensive disruption and processing of the endospores, which effects their cellular integrity and composition.Absorption edge imaging permits elemental analysis of hydrated, unstained specimens at high resolution. By taking advantage of differential absorption of x-ray photons in regions of varying elemental composition, and using a high brightness, tuneable synchrotron source to obtain monochromatic x-rays, contact x-ray micrographs can be made of unfixed, intact endospores that reveal sites of elemental localization. This study presents new data demonstrating the application of x-ray absorption edge imaging to produce elemental information about nitrogen (N) and calcium (Ca) localization using Bacillus thuringiensis as the test specimen.

scholarly journals Softer but stronger? Sulfur SAD with low energy X-rays of 2.7 Å

2014 ◽  
Vol 70 (a1) ◽  
pp. C604-C604
Author(s):  
Dorothee Liebschner ◽  
Naohiro Matsugaki ◽  
Miki Senda ◽  
Yusuke Yamada ◽  
Toshiya Senda
Keyword(s):  
Absorption Edge ◽  
Protein Crystal ◽  
X Rays ◽  
Long Wavelength ◽  
Heavy Atoms ◽  
Statistical Validity ◽  
Experimental Phasing ◽  
Recent Developments ◽  
Long Time ◽  
Anomalous Signal

Single wavelength anomalous diffraction (SAD) is a powerful experimental phasing technique used in macromolecular crystallography (MX). SAD is based on the absorption of X-rays by heavy atoms, which can be either incorporated into the protein (crystal) or naturally present in the structure, such as sulfur or metal ions. In particular, sulfur seems to be an attractive candidate for phasing, because most proteins contain a considerable number of S atoms. However, the K-absorption edge of sulfur is around 5.1 Å wavelength (2.4 keV), which is far from the optimal wavelength of most MX-beamlines at synchrotrons. Therefore, phasing experiments have to be performed further away from the absorption edge, which results in weaker anomalous signal. This explains why S-SAD was not commonly used for a long time, although its feasibility was illustrated by the ground-breaking study by Hendrickson and Teeter [1]. Recent developments in instrumentation, software and methodology made it possible to measure intensities more accurately, and, as a consequence, S-SAD has lately obtained more and more attention [2]. The beamline BL-1A at Photon factory (KEK, Japan) is designed to take full advantage of a long wavelength X-ray beam at around 3 Å to further enhance anomalous signals. We performed S-SAD experiments at BL-1A using two different wavelengths (1.9 Å and 2.7 Å) and compared their phasing capabilities. This methodological study was performed with ferredoxin reductase crystals of various sizes. In order to guarantee statistical validity and to exclude the influence of a particular sample, we repeated the comparison with several crystals. The novelty in the approach consists in using very long wavelengths (2.7 Å), not fully exploited in the literature so far. According to our study, the 2.7 Å wavelength shows - despite strong absorption effects of the diffracted X-rays - more successful phasing results than at 1.9 Å.

scholarly journals ANOMALOUS TRANSMISSION OF X-RAYS UNDER ASYMMETRICAL REFLECTION CONDITION NEAR THE ABSORPTION EDGE

1998 ◽  
Vol 47 (11) ◽  
pp. 1818
Author(s):  
XU ZHANG-CHENG ◽  
GUO CHANG-LIN ◽  
ZHAO ZONG-YAN ◽  
T.FUKAMACHI ◽  
R.NEGISHI
Keyword(s):  
Absorption Edge ◽  
X Rays ◽  
Anomalous Transmission

The Use op Field Emission Tubes in X-Ray Analysis

1971 ◽  
Vol 15 ◽  
pp. 285-294 ◽  
Author(s):  
J. H. McCrary ◽  
Ted Van Vorous
Keyword(s):  
Steady State ◽  
Field Emission ◽  
High Voltage ◽  
Absorption Edge ◽  
Power Supply ◽  
Quantitative Measure ◽  
X Rays ◽  
Absorption Analysis ◽  
X Ray ◽  
X Ray Absorption

Recently developed, miniature, steady state, field emission tubes are finding application in several areas of x-ray analysis. These tubes require only a high voltage, low current power supply to produce relatively intense beams of x-rays. Since anodes can be fabricated from almost any element, and since the tubes can be operated at potentials up to about 70 kV, many different output x-ray spectra are available. Miniaturized battery operated x-ray sources of this type, occupying a volume of about one liter, have several advantages over radioisotope sources. These include cost, safety, and controllable output spectra and intensity. X-ray sources for energy dispersive fluorescence analyzers are designed so that no scattered characteristic radiations will interfer with the analysis of the sample fluorescence. Sources which are essentially monoenergetic can be fabricated for use in non-dispersive x-ray fluorescence analyzers. Because of the intensity and safety of the field emission tubes, such analyzers can be made which are sensitive while compact, portable, and inexpensive. In x-ray absorption analysis the measurement of absorption edge jump ratios provides a quantitative measure of sample impurities. Field emission tubes whose output spectra consist primarily of bremsstrahlung are particularly well suited to such measurements. The techniques involved in using these tubes in x-ray analysis are described.

Escape Peaks in X-Ray Diffractometry*

1964 ◽  
Vol 8 ◽  
pp. 118-133 ◽  
Author(s):  
William Parrish
Keyword(s):  
Absorption Edge ◽  
Pulse Height ◽  
Pulse Amplitude ◽  
Silicon Powder ◽  
X Rays ◽  
Pulse Height Analyzer ◽  
Escape Peak ◽  
X Ray ◽  
Absorption Edge Energy ◽  
Detector Element

AbstractEscape peaks occur when the incident X-ray quantum, energy exceeds the absorption edge energy of the detector element and the resulting X-ray fluorescence is lost from the detector. The most common escape peaks result from 1 K-fluorescence in NaI-scintillation counters and Xe K-, Xe L-, and Kr K-fluorescence in proportional counters. The average pulse amplitude of the escape peak is proportional to the difference of the Energies of the incident and fluorescent X-rays. If the intensity of the escape peak is high as in the case of Mo Kα and a kryptoopreportional counter, and the lower level of the pulse height analyzer is raised to reject the escape peak, the quantum counting efficiency may be reduced by a factor of two. When the pulse height analyzer is set for characteristic incident radiation, escape peaks appear in powder patterns at small diffraction angles. These broad low-intensity peaks are often mistakenly identified as resulting from misalignment, scattering, etc. Each powder reflection can produce its own escape peak which occurs at an angle slightly smaller than the absorption edge of the detector element. In a silicon powder pattern the three strongest reflections produce three resolved escape peaks whose peak intensities are about 4% of their corresponding Cu Kα peaks when the X-ray tube is operated at 50 kV. The escape peak intensities decrease with decreasing X-ray tube voltage and disappear when the voltage is lower than the absorption edge energy of the detector element. Absorption edge peaks observed without the upper level of the pulse height analyzer are similar in appearance, intensity, and diffraction angle to the escape peaks. In complex powder patterns the escape peak pattern is unresolved and may produce a number of very broad peaks.

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