scholarly journals Second-order photon correlation measurement with picosecond resolution using frequency upconversion

2019 ◽  
Vol 44 (15) ◽  
pp. 3877
Author(s):  
Aymeric Delteil ◽  
Chun Tat Ngai ◽  
Thomas Fink ◽  
Ataç İmamoğlu
Keyword(s):  
Second Order ◽  
Correlation Measurement ◽  
Photon Correlation ◽  
Frequency Upconversion

MEASUREMENT OF THE SECOND-ORDER COHERENCE OF SYNCHROTRON RADIATION IN THE VUV REGION

2002 ◽  
Vol 09 (01) ◽  
pp. 631-634
Author(s):  
HIDETSUGU SHIOZAWA ◽  
KENJI OBU ◽  
CHOL LEE ◽  
YASUHIRO TAKAYAMA ◽  
TSUNEAKI MIYAHARA ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Second Order ◽  
Correlation Measurement ◽  
Photon Statistics ◽  
Beam Emittance ◽  
Photon Correlation ◽  
X Ray ◽  
Two Photon ◽  
Chaotic Nature

We have performed the two-photon correlation measurement of synchrotron radiation in the VUV region to characterize the photon statistics of the light. The explicit bunching effect of the second-order coherence is observed, which implies that synchrotron radiation has a chaotic nature. We also estimate the electron beam emittance of a stored beam. The two-photon correlation measurement will be utilized to diagnose the storage ring and to characterize the coherence properties of X-ray free electron laser in the future.

Quantum holography based on second-order correlation measurement

2014 ◽  
Author(s):  
Lu Gao ◽  
Kai Kang ◽  
Hailong Lin ◽  
Zhiyuan Zheng
Keyword(s):  
Second Order ◽  
Correlation Measurement

Photon Correlation Measurement of Ion Oscillation Frequencies in a Combined Trap

1992 ◽  
Vol 39 (11) ◽  
pp. 2179-2185 ◽  
Author(s):  
K. Dholakia ◽  
G.ZS.K. Horvath ◽  
D.M. Segal ◽  
R.C. Thompson
Keyword(s):  
Correlation Measurement ◽  
Photon Correlation ◽  
Oscillation Frequencies ◽  
Combined Trap

scholarly journals Photon correlation in single-photon frequency upconversion

2012 ◽  
Vol 20 (3) ◽  
pp. 2399 ◽  
Author(s):  
Xiaorong Gu ◽  
Kun Huang ◽  
Haifeng Pan ◽  
E Wu ◽  
Heping Zeng
Keyword(s):  
Single Photon ◽  
Photon Correlation ◽  
Frequency Upconversion ◽  
Photon Frequency

scholarly journals Disentangling the effects of clustering and multi-exciton emission in second-order photon correlation experiments

2013 ◽  
Vol 21 (6) ◽  
pp. 7419 ◽  
Author(s):  
Benjamin D. Mangum ◽  
Yagnaseni Ghosh ◽  
Jennifer A. Hollingsworth ◽  
Han Htoon
Keyword(s):  
Second Order ◽  
Photon Correlation ◽  
Exciton Emission

scholarly journals Measuring the dynamics of second-order photon correlation functions inside a pulse with picosecond time resolution

2010 ◽  
Vol 18 (19) ◽  
pp. 20229 ◽  
Author(s):  
Marc Aßmann ◽  
Franziska Veit ◽  
Jean-Sebastian Tempel ◽  
Thorsten Berstermann ◽  
Heinrich Stolz ◽  
...  
Keyword(s):  
Time Resolution ◽  
Correlation Functions ◽  
Second Order ◽  
Photon Correlation

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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