scholarly journals Intensity correlations enable ultrahigh resolution plasmonic structured illumination microscopy without gaps in the optical transfer function

2021 ◽  
Author(s):  
Anton Classen ◽  
Xinghua Liu ◽  
Aleksei Zheltikov ◽  
Girish Agarwal
Keyword(s):  
Transfer Function ◽  
Optical Transfer Function ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Ultrahigh Resolution ◽  
Optical Transfer

scholarly journals Tilt illumination for structured illumination imaging

2021 ◽  
Author(s):  
Xin Jin ◽  
Xuemei Ding ◽  
Jiubin Tan ◽  
Cheng Shen ◽  
Xuyang Zhou ◽  
...  
Keyword(s):  
Transfer Function ◽  
Super Resolution ◽  
Lateral Resolution ◽  
Optical Transfer Function ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Sample Spectrum ◽  
Resolution Imaging ◽  
Optical Transfer ◽  
Illumination Mode

Abstract To achieve super-resolution imaging, the information in higher frequency of the observed sample is collected by illuminating with a structure beam for a limited optical transfer function (OTF). In this paper, tilt illumination mode is introduced to structured illumination microscopy (SIM) for enhancing lateral resolution. More sample spectrum more than traditional SIM, can be obtained by detector. Thus, SIM with tilt illumination can be improved at the aspect of lateral imaging resolution.

Optical transfer function engineering for a tunable 3D structured illumination microscope

2019 ◽  
Vol 44 (7) ◽  
pp. 1560
Author(s):  
Hasti Shabani ◽  
Ana Doblas ◽  
Genaro Saavedra ◽  
Chrysanthe Preza
Keyword(s):  
Transfer Function ◽  
Optical Transfer Function ◽  
Structured Illumination ◽  
Optical Transfer

scholarly journals Successful optimization of reconstruction parameters in structured illumination microscopy – a practical guide

2018 ◽  
Author(s):  
C. Karras ◽  
M. Smedh ◽  
R. Förster ◽  
H. Deschout ◽  
J. Fernandez-Rodriguez ◽  
...  
Keyword(s):  
Wiener Filter ◽  
Super Resolution ◽  
Optical Transfer Function ◽  
Structured Illumination ◽  
Structured Illumination Microscopy ◽  
Filter Parameter ◽  
Two Samples ◽  
Optical Transfer ◽  
The Impact ◽  
Zero Frequency

AbstractThe impact of the different reconstruction parameters in super-resolution structured illumination microscopy (SIM) onto artifacts is carefully analyzed. They comprise the Wiener filter parameter, an apodization function, zero-frequency suppression and modifications of the optical transfer function. A detailed investigation of the reconstructed image spectrum is concluded to be suitable for identifying artifacts. For this purpose, two samples, an artificial test slide and a more realistic biological system, were used to characterize the artifact classes and their correlation with the image spectra as well as the reconstruction parameters. In addition, a guideline for efficient parameter optimization is suggested and the implementation of the parameters in selected up-to-date processing packages (proprietary and open-source) is depicted.

Optical transfer function and aberration

Optik ◽  
2020 ◽  
Vol 206 ◽  
pp. 164243
Author(s):  
Yu Bai ◽  
Jiaqi Chen ◽  
Qi Lu ◽  
Zhenming Zhao
Keyword(s):  
Transfer Function ◽  
Optical Transfer Function ◽  
Optical Transfer
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