An optical phasing method based on scanning white-light interferometry for multi-aperture optical telescope

2021 ◽  
Author(s):  
Yang Li ◽  
ShengQian Wang
Keyword(s):  
White Light ◽  
White Light Interferometry ◽  
Optical Telescope ◽  
Scanning White Light Interferometry

scholarly journals Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2486
Author(s):  
Gert Behrends ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
White Light ◽  
Lateral Displacement ◽  
Displacement Measurement ◽  
Accurate Information ◽  
White Light Interferometry ◽  
Fully Integrated ◽  
Speckle Correlation ◽  
Dsc Measurements ◽  
Scanning White Light Interferometry ◽  
The Impact

Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.

Hybrid light source for scanning white light interferometry-based MEMS quality control

2011 ◽  
Author(s):  
V. Heikkinen ◽  
K. Hanhijärvi ◽  
J. Aaltonen ◽  
H. Räikkönen ◽  
B. Wälchli ◽  
...  
Keyword(s):  
Quality Control ◽  
Light Source ◽  
White Light ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

Study on key algorithm for scanning white-light interferometry

2008 ◽  
Author(s):  
Ailing Tian ◽  
Chunhui Wang ◽  
Zhuangde Jiang ◽  
Hongjun Wang ◽  
Bingcai Liu
Keyword(s):  
White Light ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry
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