scholarly journals Single-shot, omni-directional x-ray scattering imaging with a laboratory source and single-photon localization

2020 ◽  
Vol 45 (4) ◽  
pp. 1021 ◽  
Author(s):  
Erik S. Dreier ◽  
Chantal Silvestre ◽  
Jan Kehres ◽  
Daniel Turecek ◽  
Mohamad Khalil ◽  
...  
Keyword(s):  
Single Photon ◽  
Single Shot ◽  
X Ray ◽  
X Ray Scattering ◽  
Laboratory Source ◽  
Photon Localization ◽  
Ray Scattering

Single-Shot Time-Resolved X-Ray Scattering Measurements of Polycrystalline and Amorphous Materials Under Shock Wave Loading

PRICM ◽  
2013 ◽  
pp. 3489-3496
Author(s):  
Kouhei Ichiyanagi ◽  
Kawai Nobuaki ◽  
Shunsuke Nozawa ◽  
Tokushi Sato ◽  
Jianbo Hu ◽  
...  
Keyword(s):  
Shock Wave ◽  
Amorphous Materials ◽  
Single Shot ◽  
Shock Wave Loading ◽  
Wave Loading ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Measurements ◽  
Ray Scattering

scholarly journals Fast acquisition protocol for X-ray scattering tensor tomography

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jisoo Kim ◽  
Matias Kagias ◽  
Federica Marone ◽  
Zhitian Shi ◽  
Marco Stampanoni
Keyword(s):  
Null Space ◽  
Sufficient Information ◽  
Single Shot ◽  
Time Resolved ◽  
X Ray ◽  
Circular Pattern ◽  
Rapid Acquisition ◽  
Tensor Tomography ◽  
X Ray Scattering ◽  
Ray Scattering

AbstractMicrostructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.

scholarly journals Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities

2019 ◽  
Vol 26 (5) ◽  
pp. 1432-1447 ◽  
Author(s):  
Andreas Galler ◽  
Wojciech Gawelda ◽  
Mykola Biednov ◽  
Christina Bomer ◽  
Alexander Britz ◽  
...  
Keyword(s):  
Pulse Length ◽  
Scientific Instrument ◽  
Single Shot ◽  
Simultaneous Application ◽  
X Ray ◽  
Ultrafast Optical ◽  
Near Ir ◽  
X Ray Scattering ◽  
Beam Parameters ◽  
Ray Scattering

The European X-ray Free-Electron Laser (EuXFEL) delivers extremely intense (>1012 photons pulse−1 and up to 27000 pulses s−1), ultrashort (<100 fs) and transversely coherent X-ray radiation, at a repetition rate of up to 4.5 MHz. Its unique X-ray beam parameters enable novel and groundbreaking experiments in ultrafast photochemistry and material sciences at the Femtosecond X-ray Experiments (FXE) scientific instrument. This paper provides an overview of the currently implemented experimental baseline instrumentation and its performance during the commissioning phase, and a preview of planned improvements. FXE's versatile instrumentation combines the simultaneous application of forward X-ray scattering and X-ray spectroscopy techniques with femtosecond time resolution. These methods will eventually permit exploitation of wide-angle X-ray scattering studies and X-ray emission spectroscopy, along with X-ray absorption spectroscopy, including resonant inelastic X-ray scattering and X-ray Raman scattering. A suite of ultrafast optical lasers throughout the UV–visible and near-IR ranges (extending up to mid-IR in the near future) with pulse length down to 15 fs, synchronized to the X-ray source, serve to initiate dynamic changes in the sample. Time-delayed hard X-ray pulses in the 5–20 keV range are used to probe the ensuing dynamic processes using the suite of X-ray probe tools. FXE is equipped with a primary monochromator, a primary and secondary single-shot spectrometer, and a timing tool to correct the residual timing jitter between laser and X-ray pulses.

Single-shot studies of a Co/Pd thin film’s magnetic nano-domain structure using ultrafast x-ray scattering

Laser Physics ◽  
2014 ◽  
Vol 24 (2) ◽  
pp. 025301 ◽  
Author(s):  
M Ducousso ◽  
X Ge ◽  
W Boutu ◽  
D Gauthier ◽  
B Barbrel ◽  
...  
Keyword(s):  
Domain Structure ◽  
Single Shot ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals MHz pump and probe combined with XAS-XES

2014 ◽  
Vol 70 (a1) ◽  
pp. C127-C127
Author(s):  
Pieter Glatzel
Keyword(s):  
Single Photon ◽  
Pulse Length ◽  
Photon Counting ◽  
European Synchrotron Radiation Facility ◽  
Theoretical Interpretation ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Pump And Probe ◽  
Ray Scattering

We implemented a MHz pump and probe scheme on beamline ID26 of the European Synchrotron Radiation Facility. The laser runs at 1.4 MHz in the ESRF 16b mode and thus pumps every fourth pulse with ca. 15 uJ per pulse and 350 fs pulse length. The beamline hosts an X-ray emission spectrometer and thus allows combining resonant inelastic X-ray scattering with a MHz pump and probe schemes. The scattered X-rays are recorded with an avalanche photodiode in single photon counting mode. We measured the transient spectra of the spin cross-over transition in [Fe(bpy)3]Cl2 of the non-resonant Ka lines and of 1s2p resonant inelastic X-ray scattering (RIXS) at the K absorption pre-edge of Fe. The Ka transient spectrum can be readily modeled using crystal field multiplet calculations because the spectra mainly depend on the Fe spin state. The 1s2p RIXS is richer in information because it also probes the unoccupied molecular orbitals and a theoretical interpretation is more challenging.

scholarly journals Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays

IUCrJ ◽  
2020 ◽  
Vol 7 (2) ◽  
pp. 276-286 ◽  
Author(s):  
Akinobu Niozu ◽  
Yoshiaki Kumagai ◽  
Toshiyuki Nishiyama ◽  
Hironobu Fukuzawa ◽  
Koji Motomura ◽  
...  
Keyword(s):  
Free Electron ◽  
Structural Information ◽  
Single Shot ◽  
X Ray Diffraction ◽  
X Ray ◽  
Angular Correlations ◽  
Crystalline Defects ◽  
X Ray Scattering ◽  
Diffraction Patterns ◽  
Ray Scattering

Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray pulses provided by X-ray free-electron lasers (XFELs) opened up the possibility of structure determination of nanometre-scale matter with Å spatial resolution. However, it is often difficult to reconstruct the 3D structural information from single-shot X-ray diffraction patterns owing to the random orientation of the particles. This report proposes an analysis approach for characterizing defects in nanoparticles using wide-angle X-ray scattering (WAXS) data from free-flying single nanoparticles. The analysis method is based on the concept of correlated X-ray scattering, in which correlations of scattered X-ray are used to recover detailed structural information. WAXS experiments of xenon nanoparticles, or clusters, were conducted at an XFEL facility in Japan by using the SPring-8 Ångstrom compact free-electron laser (SACLA). Bragg spots in the recorded single-shot X-ray diffraction patterns showed clear angular correlations, which offered significant structural information on the nanoparticles. The experimental angular correlations were reproduced by numerical simulation in which kinematical theory of diffraction was combined with geometric calculations. We also explain the diffuse scattering intensity as being due to the stacking faults in the xenon clusters.

scholarly journals 2D-Omnidirectional Hard-X-Ray Scattering Sensitivity in a Single Shot

2016 ◽  
Vol 116 (9) ◽  
Author(s):  
Matias Kagias ◽  
Zhentian Wang ◽  
Pablo Villanueva-Perez ◽  
Konstantins Jefimovs ◽  
Marco Stampanoni
Keyword(s):  
Single Shot ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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