Fabrication of Fresnel zone plates by ion-beam lithography and application as objective lenses in extreme ultraviolet microscopy at 13 nm wavelength

2012 ◽  
Vol 37 (24) ◽  
pp. 5100 ◽  
Author(s):  
Johannes Overbuschmann ◽  
Julia Hengster ◽  
Stephan Irsen ◽  
Thomas Wilhein
2013 ◽  
Vol 21 (10) ◽  
pp. 11747 ◽  
Author(s):  
Kahraman Keskinbora ◽  
Corinne Grévent ◽  
Michael Bechtel ◽  
Markus Weigand ◽  
Eberhard Goering ◽  
...  

2007 ◽  
Vol 17 (3) ◽  
pp. 617-622 ◽  
Author(s):  
A Surpi ◽  
S Valizadeh ◽  
K Leifer ◽  
S Lagomarsino

2010 ◽  
Vol 87 (5-8) ◽  
pp. 854-858 ◽  
Author(s):  
Sankha S. Sarkar ◽  
Harun H. Solak ◽  
Jörg Raabe ◽  
Christian David ◽  
J. Friso van der Veen

2019 ◽  
Vol 58 (4) ◽  
pp. 1057 ◽  
Author(s):  
A. Schümmer ◽  
H.-Ch. Mertins ◽  
Claus Michael Schneider ◽  
Roman Adam ◽  
Stefan Trellenkamp ◽  
...  

2009 ◽  
Vol 186 ◽  
pp. 012071 ◽  
Author(s):  
Sankha S Sarkar ◽  
Pratap K Sahoo ◽  
Harun H Solak ◽  
Christian David ◽  
J Friso van der Veen

2014 ◽  
Vol 21 (3) ◽  
pp. 640-640 ◽  
Author(s):  
Marcel Mayer ◽  
Kahraman Keskinbora ◽  
Corinne Grévent ◽  
Adriana Szeghalmi ◽  
Mato Knez ◽  
...  

Corrections to the article by Mayeret al.[J. Synchrotron Rad.(2013),20, 433–440] are given.


2019 ◽  
Vol 58 (08) ◽  
pp. 1
Author(s):  
Jie Chen ◽  
Junhua Wang ◽  
Bangjun Ma ◽  
Xiaolong Wang ◽  
Dengpeng Yuan ◽  
...  

2018 ◽  
Vol 9 ◽  
pp. 2049-2056 ◽  
Author(s):  
Kahraman Keskinbora ◽  
Umut Tunca Sanli ◽  
Margarita Baluktsian ◽  
Corinne Grévent ◽  
Markus Weigand ◽  
...  

Fresnel zone plates (FZP) are diffractive photonic devices used for high-resolution imaging and lithography at short wavelengths. Their fabrication requires nano-machining capabilities with exceptional precision and strict tolerances such as those enabled by modern lithography methods. In particular, ion beam lithography (IBL) is a noteworthy method thanks to its robust direct writing/milling capability. IBL allows for rapid prototyping of high-resolution FZPs that can be used for high-resolution imaging at soft X-ray energies. Here, we discuss improvements in the process enabling us to write zones down to 15 nm in width, achieving an effective outermost zone width of 30 nm. With a 35% reduction in process time and an increase in resolution by 26% compared to our previous results, we were able to resolve 21 nm features of a test sample using the FZP. The new process conditions are then applied for fabrication of large arrays of high-resolution zone plates. Results show that relatively large areas can be decorated with nanostructured devices via IBL by using multipurpose SEM/FIB instruments with potential applications in FEL focusing, extreme UV and soft X-ray lithography and as wavefront sensing devices for beam diagnostics.


Author(s):  
Sankha S. Sarkar ◽  
Pratap K. Sahoo ◽  
Harun H. Solak ◽  
Christian David ◽  
J. Friso Van der Veen

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