Cascaded dynamic eigenstates of polarization analysis for piezoelectric polarization control

2007 ◽  
Vol 32 (19) ◽  
pp. 2900 ◽  
Author(s):  
Zhengyong Li ◽  
Chongqing Wu ◽  
Hui Dong ◽  
P. Shum
2007 ◽  
Author(s):  
Zhengyong Li ◽  
Chongqing Wu ◽  
S. S. Yang ◽  
C. Y. Tian ◽  
M. Cheng ◽  
...  

2008 ◽  
Vol 25 (4) ◽  
pp. 1325-1328 ◽  
Author(s):  
Li Zheng-Yong ◽  
Wu Chong-Qing ◽  
Yang Shuang-Shou ◽  
Tian Chang-Yong ◽  
Zhao Shuang ◽  
...  

Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-199-C8-200
Author(s):  
N. Fanjat ◽  
O. Schaerpf ◽  
J. L. Soubeyroux ◽  
A. J. Dianoux ◽  
G. Lucazeau

Author(s):  
Balakrishnam Jampana ◽  
Andrew Melton ◽  
Muhammad Jamil ◽  
Ian Ferguson ◽  
Robert Opila ◽  
...  

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