Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry

2000 ◽  
Vol 25 (15) ◽  
pp. 1068 ◽  
Author(s):  
James M. Kilpatrick ◽  
Andrew J. Moore ◽  
James S. Barton ◽  
Julian D. C. Jones ◽  
Mark Reeves ◽  
...  
Keyword(s):  
High Speed ◽  
Surface Deformation ◽  
Speckle Pattern ◽  
Complex Surface ◽  
Digital Speckle Pattern Interferometry ◽  
Dynamic Phase ◽  
Digital Speckle

Study on Displacement Measurement for Induced Strain Field Based on Digital Speckle Pattern Interferometry Method

2013 ◽  
Vol 273 ◽  
pp. 510-514
Author(s):  
Jing Liu ◽  
Hui Zhang ◽  
Jun Li ◽  
Da Chuan Chen ◽  
Yan Kun Tang
Keyword(s):  
Strain Field ◽  
High Speed ◽  
Speckle Pattern ◽  
Measuring Method ◽  
Full Field ◽  
Digital Speckle Pattern Interferometry ◽  
Level Measurement ◽  
On Line ◽  
Interferometry Method ◽  
Digital Speckle

Digital Speckle Pattern Interferometry ( DSPI for short ) method has become one of the most practical worthy techniques for speckle measuring methods with the high-speed development of optic-electronical technique, image processing technology and electronic computer technology. There is a lot of advantages about it, such as uncomplicated operation, non-contacting, advanced automatic level, measurement on-line and extensive using. In this thesis, the displacement variation of the induced strain field for driving by piezoelectric ceramics can be measured by using this method. Thus we can come to a conclusion that digital speckle pattern interferometry is a new measuring method for extracting small-signal. It also provides a powerfully theoretical and experimental platform for study of automated, full-field, high-precision and nondestructive measurement.

Simultaneous Measurement of In-Plane and Out-of-Plane Deformations Using Dual-Beam Spatial-Carrier Digital Speckle Pattern Interferometry

2015 ◽  
Vol 782 ◽  
pp. 316-325 ◽  
Author(s):  
Kai Liu ◽  
Si Jin Wu ◽  
Xin Ya Gao ◽  
Lian Xiang Yang
Keyword(s):  
High Speed ◽  
Phase Retrieval ◽  
Speckle Pattern ◽  
High Tech ◽  
Advanced Technique ◽  
Digital Speckle Pattern Interferometry ◽  
Dual Beam ◽  
Out Of Plane ◽  
Digital Speckle ◽  
Plane Deformations

Digital speckle pattern interferometry (DSPI) is an advanced technique for both in-plane and out-of-plane deformation measurements of diffuse surfaces in nanoscale. It has been widely used in aerospace engineering and other high-tech industries due to the advantages of non-contact, high-accuracy and full-field measurement. Traditionally, DSPI uses temporal phase shifting method to achieve precise deformation measurement, but it is only suitable for quasi-static deformation. Spatial-carrier method is another effective phase retrieval method used in DSPI and its validity has been verified in some DSPI setups. DSPI with spatial-carrier method enjoys the advantages of simple optical arrangement, easy operation, and above all, high-speed measurement of deformation. This paper introduces a dual-beam spatial-carrier digital speckle pattern interferometry system, with which in-plane and out-of-plane deformations can be measured simultaneously as well as quickly. In the optical setup, two lasers are employed to illuminate the measured object with different illumination angles, and two single-mode fibers server as carriers to transmit the reference beams. In-plane and out-of-plane deformations can be obtained by combining the phase maps of both channels. Theoretical discussion and experimental analysis are both presented.

Spatial carrier color digital speckle pattern interferometry for absolute three-dimensional deformation measurement

2017 ◽  
Vol 56 (6) ◽  
pp. 066107 ◽  
Author(s):  
Xinya Gao ◽  
Yonghong Wang ◽  
Junrui Li ◽  
Xizuo Dan ◽  
Sijin Wu ◽  
...  
Keyword(s):  
Speckle Pattern ◽  
Three Dimensional ◽  
Deformation Measurement ◽  
Digital Speckle Pattern Interferometry ◽  
Digital Speckle
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