Time-resolved temperature measurements in a laboratory flame using the optoacoustic beam-deflection method

1985 ◽  
Vol 10 (7) ◽  
pp. 324 ◽  
Author(s):  
Dennis F. Grosjean ◽  
Benjamin Sarka ◽  
Larry P. Goss
Keyword(s):  
Temperature Measurements ◽  
Beam Deflection ◽  
Time Resolved

scholarly journals Sulfophosphate Glass Doped with Er3+ and TiO2 Nanoparticles: Thermo-Optical Characterization by Photothermal Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (4) ◽  
pp. 115
Author(s):  
Zeinab Ebrahimpour ◽  
Humberto Cabrera ◽  
Fahimeh Ahmadi ◽  
Asghar Asgari ◽  
Joseph Niemela
Keyword(s):  
Optical Properties ◽  
Tio2 Nanoparticles ◽  
Refractive Index Change ◽  
Optical Path Length ◽  
Beam Deflection ◽  
Time Resolved ◽  
Tio2 Nps ◽  
Amorphous Glass ◽  
Laser Media ◽  
Materials Used

In this work, time-resolved thermal lens and beam deflection methods were applied to determine the thermo-optical properties of Er3+ doped sulfophosphate glass in which different concentrations of Titanium dioxide (TiO2) nanoparticles (NPs) were embedded. Thermal diffusivity (D), thermal conductivity (κ), and the temperature coefficient of the optical path length (ds/dT) were determined as a function of NPs concentrations. Moreover, the growth of TiO2 NPs inside the amorphous glass matrix was evidenced by Transmission Electron Microscopy (TEM) images as well as through optical effects such as refractive index change of the glass. The outcomes indicated relatively high values for D and κ as well as a low ds/dT as required for most optical components used for laser media. The addition of TiO2 NPs with concentration of dopants up to 0.6 mol% improved the optical properties of the glass samples but did not affect its thermal properties. The results indicate that the enhanced optical and thermal performance of the proposed co-doped glass fits the quality standards for materials used in photonic devices.

scholarly journals Time-Resolved On-Axis Spectroscopic Stagnation Temperature Measurements in Shock Tunnel Flows

2019 ◽  
Vol 3 (2) ◽  
pp. 6
Author(s):  
Hartmut Borchert ◽  
Stefan Brieschenk ◽  
Berthold Sauerwein
Keyword(s):  
Shock Tunnel ◽  
Temperature Measurements ◽  
Stagnation Temperature ◽  
Time Resolved

Time-Resolved Micro-Raman Thermometry for Microsystems in Motion

2008 ◽  
Vol 130 (12) ◽  
Author(s):  
Justin R. Serrano ◽  
Sean P. Kearney
Keyword(s):  
Microelectromechanical Systems ◽  
Diagnostic Technique ◽  
Temperature Measurements ◽  
Transient Temperature ◽  
Raman Signal ◽  
Periodic Signal ◽  
Fast Time ◽  
Time Resolved ◽  
Microelectromechanical Devices ◽  
Reliable Temperature

Micro-Raman thermometry has been demonstrated to be a feasible technique for obtaining surface temperatures with micron-scale spatial resolution for microelectronic and microelectromechanical systems (MEMSs). However, the intensity of the Raman signal emerging from the probed device is very low and imposes a requirement of prolonged data collection times in order to obtain reliable temperature information. This characteristic currently limits Raman thermometry to steady-state conditions and thereby prevents temperature measurements of transient and fast time-scale events. In this paper, we discuss the extension of the micro-Raman thermometry diagnostic technique to obtain transient temperature measurements on microelectromechanical devices with 100 μs temporal resolution. Through the use of a phase-locked technique we are able to obtain temperature measurements on electrically powered MEMS actuators powered with a periodic signal. Furthermore, we demonstrate a way of obtaining reliable temperature measurements on micron-scale devices that undergo mechanical movement during the device operation.

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