GaAs laser array source package

1977 ◽  
Vol 1 (1) ◽  
pp. 40 ◽  
Author(s):  
John D. Crow ◽  
Liam D. Comerford ◽  
Robert A. Laff ◽  
Michael J. Brady ◽  
John S. Harper
Keyword(s):  
Laser Array ◽  
Gaas Laser ◽  
Laser Array Source

High power InGaAs/GaAs laser array

1990 ◽  
Vol 26 (21) ◽  
pp. 1816 ◽  
Author(s):  
N.K. Dutta ◽  
J.D. Wynn ◽  
J. Lopata ◽  
D.L. Sivco ◽  
A.Y. Cho
Keyword(s):  
High Power ◽  
Laser Array ◽  
Gaas Laser

KW-output high beam quality diode laser array source

2012 ◽  
Author(s):  
Xiaonan Shan ◽  
Jun Zhang ◽  
Hangyu Peng ◽  
Xihong Fu ◽  
Yun Liu ◽  
...  
Keyword(s):  
Diode Laser ◽  
Beam Quality ◽  
Laser Array ◽  
High Beam ◽  
High Beam Quality ◽  
Laser Array Source

Study on an optical system with coherent laser array source and phase optimization in turbulent atmosphere

Optik ◽  
2013 ◽  
Vol 124 (23) ◽  
pp. 6231-6235 ◽  
Author(s):  
Huiyun Wu ◽  
Xin Li ◽  
Shen Sheng ◽  
Zhisong Huang ◽  
Shuhai Huang ◽  
...  
Keyword(s):  
Optical System ◽  
Turbulent Atmosphere ◽  
Laser Array ◽  
Phase Optimization ◽  
Laser Array Source

Uniformly Polarized GaAs Laser Array

1972 ◽  
Vol 20 (8) ◽  
pp. 311-312 ◽  
Author(s):  
Harold Wieder ◽  
John C. Marinace
Keyword(s):  
Laser Array ◽  
Gaas Laser

Scanned tip measurement of deep vertical facets on a flat surface: Measuring roughness on gaas laser waveguide mirrors

1993 ◽  
Vol 51 ◽  
pp. 532-533
Author(s):  
Chang Shen ◽  
Phil Fraundorf ◽  
Robert W. Harrick
Keyword(s):  
Integrated Circuits ◽  
Flat Surface ◽  
Scanning Force Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Optoelectronic Integrated Circuits ◽  
Laser Waveguide ◽  
Scanning Force ◽  
Gaas Laser

Monolithic integration of optoelectronic integrated circuits (OEIC) requires high quantity etched laser facets which prevent the developing of more-highly-integrated OEIC's. The causes of facet roughness are not well understood, and improvement of facet quality is hampered by the difficulty in measuring the surface roughness. There are several approaches to examining facet roughness qualitatively, such as scanning force microscopy (SFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). The challenge here is to allow more straightforward monitoring of deep vertical etched facets, without the need to cleave out test samples. In this presentation, we show air based STM and SFM images of vertical dry-etched laser facets, and discuss the image acquisition and roughness measurement processes. Our technique does not require precision cleaving. We use a traditional tip instead of the T shape tip used elsewhere to preventing “shower curtain” profiling of the sidewall. We tilt the sample about 30 to 50 degrees to avoid the curtain effect.

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