Tunable Epsilon-Near-Zero ITO Thin Films and Broadband Perfect Absorption in the Near-Infrared

2016 ◽  
Author(s):  
Junho Yoon ◽  
Tae Young Kim ◽  
Wonyoung Kim ◽  
Young Chul Jun ◽  
Chang Kwon Hwangbo
Keyword(s):  
Thin Films ◽  
Near Infrared ◽  
Perfect Absorption ◽  
Ito Thin Films ◽  
Epsilon Near Zero

scholarly journals Broadband Epsilon-Near-Zero Perfect Absorption in the Near-Infrared

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Junho Yoon ◽  
Ming Zhou ◽  
Md. Alamgir Badsha ◽  
Tae Young Kim ◽  
Young Chul Jun ◽  
...  
Keyword(s):  
Near Infrared ◽  
Perfect Absorption ◽  
Epsilon Near Zero

scholarly journals Out-of-Plane Thermal Expansion Coefficient and Biaxial Young’s Modulus of Sputtered ITO Thin Films

Coatings ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 153
Author(s):  
Chuen-Lin Tien ◽  
Tsai-Wei Lin
Keyword(s):  
Thin Films ◽  
Thermal Expansion ◽  
Thermal Stress ◽  
Young’S Modulus ◽  
Thermal Expansion Coefficient ◽  
Expansion Coefficient ◽  
Young's Modulus ◽  
Heating Temperature ◽  
Glass Substrates ◽  
Ito Thin Films

This paper proposes a measuring apparatus and method for simultaneous determination of the thermal expansion coefficient and biaxial Young’s modulus of indium tin oxide (ITO) thin films. ITO thin films simultaneously coated on N-BK7 and S-TIM35 glass substrates were prepared by direct current (DC) magnetron sputtering deposition. The thermo-mechanical parameters of ITO thin films were investigated experimentally. Thermal stress in sputtered ITO films was evaluated by an improved Twyman–Green interferometer associated with wavelet transform at different temperatures. When the heating temperature increased from 30 °C to 100 °C, the tensile thermal stress of ITO thin films increased. The increase in substrate temperature led to the decrease of total residual stress deposited on two glass substrates. A linear relationship between the thermal stress and substrate heating temperature was found. The thermal expansion coefficient and biaxial Young’s modulus of the films were measured by the double substrate method. The results show that the out of plane thermal expansion coefficient and biaxial Young’s modulus of the ITO film were 5.81 × 10−6 °C−1 and 475 GPa.

scholarly journals High quality ITO thin films grown by dc and RF sputtering without oxygen

2010 ◽  
Vol 43 (5) ◽  
pp. 055402 ◽  
Author(s):  
Ocal Tuna ◽  
Yusuf Selamet ◽  
Gulnur Aygun ◽  
Lutfi Ozyuzer
Keyword(s):  
Thin Films ◽  
Rf Sputtering ◽  
High Quality ◽  
Ito Thin Films
Sign in / Sign up

Export Citation Format

Share Document