Synchronization Algorithm for SDN-controlled All-Optical TDM Switching in a Random Length Ring Network

2016 ◽  
Author(s):  
V. Kamchevska ◽  
V. Cristofori ◽  
F. Da Ros ◽  
B. Guo ◽  
C. Jackson ◽  
...  
Keyword(s):  
Ring Network ◽  
Synchronization Algorithm ◽  
All Optical ◽  
Tdm Switching

Design and investigation of an all-optical WDM ring-network

1998 ◽  
Author(s):  
Doutje T. van Veen ◽  
Erwin Rikkers ◽  
Federiko N. Krommendijk ◽  
B. H. Sikken ◽  
G. J. M. Krijnen ◽  
...  
Keyword(s):  
Ring Network ◽  
Optical Wdm ◽  
All Optical

An all-optical packet-switched ring network

2005 ◽  
Author(s):  
P.K.A. Wai ◽  
Lixin Xu ◽  
L.F.K. Lui ◽  
L.Y. Chan ◽  
C.C. Lee ◽  
...  
Keyword(s):  
Ring Network ◽  
All Optical

Multiwavelength erbium-doped power limiting amplifier in all-optical self-healing ring network

1996 ◽  
Vol 8 (6) ◽  
pp. 842-844 ◽  
Author(s):  
Yung-Kuang Chen ◽  
Shien-Kuei Liaw ◽  
Wann-Yih Guo ◽  
Sien Chi
Keyword(s):  
Self Healing ◽  
Ring Network ◽  
Limiting Amplifier ◽  
Erbium Doped ◽  
All Optical

scholarly journals Synchronization in a Random Length Ring Network for SDN-Controlled Optical TDM Switching

2016 ◽  
Vol 9 (1) ◽  
pp. A26 ◽  
Author(s):  
Valerija Kamchevska ◽  
Valentina Cristofori ◽  
Francesco Da Ros ◽  
Bingli Guo ◽  
Chris Jackson ◽  
...  
Keyword(s):  
Ring Network ◽  
Tdm Switching

Multiwavelength all-optical TDM switching using a semiconductor optical amplifier in a loop mirror

1999 ◽  
Vol 11 (3) ◽  
pp. 331-333 ◽  
Author(s):  
B.K. Mathason ◽  
H. Shi ◽  
I. Nitta ◽  
G.A. Alphonse ◽  
J. Abeles ◽  
...  
Keyword(s):  
Semiconductor Optical Amplifier ◽  
Optical Amplifier ◽  
All Optical ◽  
Loop Mirror ◽  
Tdm Switching

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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