Research on high-speed single-frequency semiconductor lasers

1985 ◽  
Author(s):  
Herwig Kogelnik
Keyword(s):  
Semiconductor Lasers ◽  
High Speed ◽  
Single Frequency

The Radio Probe™: A New Measurement Tool for High Speed Integrated Circuits

2005 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Integrated Circuits ◽  
Integrated Circuit ◽  
High Speed ◽  
Attenuation Factor ◽  
Cost Effective ◽  
Frequency Measurement ◽  
Single Frequency ◽  
Measurement Tool ◽  
Probe Design ◽  
Differential Measurement

Abstract This article presents a novel tool designed to allow circuit node measurements in a radio frequency (RF) integrated circuit. The discussion covers RF circuit problems; provides details on the Radio Probe design, which achieves an input impedance of 50Kohms and an overall attenuation factor of 0 dB; and describes signal to noise issues in the output signal, along with their improvement techniques. This cost-effective solution incorporates features that make it well suited to the task of differential measurement of circuit nodes within an RF IC. The Radio Probe concept offers a number of advantages compared to active probes. It is a single frequency measurement tool, so it complements, rather than replaces, active probes.

Optical correlation measurement of switching transients in high-speed semiconductor lasers

1986 ◽  
Vol 22 (7) ◽  
pp. 396 ◽  
Author(s):  
J.M. Wiesenfeld ◽  
R.S. Tucker ◽  
P.M. Downey ◽  
J.E. Bowers
Keyword(s):  
Semiconductor Lasers ◽  
High Speed ◽  
Correlation Measurement ◽  
Optical Correlation

scholarly journals Noise caused by semiconductor lasers in high-speed fiber-optic links

1989 ◽  
Vol 7 (4) ◽  
pp. 657-665 ◽  
Author(s):  
C.M. Olsen ◽  
K.E. Stubkjaer ◽  
H. Olesen
Keyword(s):  
Semiconductor Lasers ◽  
High Speed ◽  
Fiber Optic

Microwave Holographic Surface Measurement of the Tidbinbilla 64-m Antenna

1983 ◽  
Vol 5 (2) ◽  
pp. 270-272 ◽  
Author(s):  
Y. Rahmat-Samii ◽  
S. Gulkis ◽  
G.S. Levy ◽  
B.L Seidel ◽  
L.E. Young ◽  
...  
Keyword(s):  
High Speed ◽  
Survey Methods ◽  
Low Cost ◽  
Single Frequency ◽  
Surface Measurement ◽  
Antenna Aperture ◽  
Phase Fluctuations ◽  
Surface Deviations ◽  
Antenna Surface ◽  
Surface Figure

The ‘holographic’ technique for accurately measuring the surface figure of large reflector antennas, described by Bennet et al, (1976) and Scott and Ryle (1977), has many advantages over older conventional survey methods. These include high speed, low cost, and the absence of any need for additional complex mechanical or optical survey devices. In essence, the technique consists of measuring the complex far-field response of the antenna at a single frequency using a terrestrial, satellite-borne or celestial radiation source of small angular diameter. This two-dimensional pattern is then Fourier-transformed to yield the complex illumination function across the antenna aperture. Antenna surface deviations are manifested as phase fluctuations in this function. In practice, a second antenna is needed to provide a phase reference.

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