scholarly journals Resonant Cavity-Enhanced Photodiode Array for Miniaturised Spectroscopic Sensing

2021 ◽  
Author(s):  
Andrew Bainbridge ◽  
Laura Hanks ◽  
Adam Craig ◽  
Andrew Marshall
Keyword(s):  
Resonant Cavity ◽  
Photodiode Array

Analysis of electron-diffraction intensity profiles using a photodiode-array detection system

1983 ◽  
Vol 41 ◽  
pp. 322-323
Author(s):  
J. B. Warren
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Detection System ◽  
High Energy ◽  
Photographic Emulsion ◽  
Diffraction Intensity ◽  
Silicon Photodiode ◽  
Photodiode Array Detection ◽  
Analog To Digital ◽  
Photodiode Array

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.

Confocal Raman mapping

1992 ◽  
Vol 50 (2) ◽  
pp. 1514-1515
Author(s):  
J. Barbillat ◽  
M. Delhaye ◽  
P. Dhamelincourt
Keyword(s):  
Chemical Species ◽  
Diffraction Limit ◽  
Microscopic Level ◽  
Raman Mapping ◽  
Complete Spectrum ◽  
Laser Illumination ◽  
Ccd Detector ◽  
Raman Microprobe ◽  
Photodiode Array ◽  
Raman Image

Raman mapping, with a spatial resolution close to the diffraction limit, can help to reveal the distribution of chemical species at the surface of an heterogeneous sample.As early as 1975,three methods of sample laser illumination and detector configuration have been proposed to perform Raman mapping at the microscopic level (Fig. 1),:- Point illumination:The basic design of the instrument is a classical Raman microprobe equipped with a PM tube or either a linear photodiode array or a two-dimensional CCD detector. A laser beam is focused on a very small area ,close to the diffraction limit.In order to explore the whole surface of the sample,the specimen is moved sequentially beneath the microscope by means of a motorized XY stage. For each point analyzed, a complete spectrum is obtained from which spectral information of interest is extracted for Raman image reconstruction.- Line illuminationA narrow laser line is focused onto the sample either by a cylindrical lens or by a scanning device and is optically conjugated with the entrance slit of the stigmatic spectrograph.

Techniques for assessing the performance of circuit materials at microwave and millimetre-wave frequencies

2003 ◽  
Vol 783 ◽  
Author(s):  
Charles E Free
Keyword(s):  
Loss Tangent ◽  
Good Accuracy ◽  
Low Cost ◽  
Resonant Cavity ◽  
New Technique ◽  
Millimetre Wave ◽  
A New Technique

This paper discusses the techniques that are available for characterising circuit materials at microwave and millimetre wave frequencies. In particular, the paper focuses on a new technique for measuring the loss tangent of substrates at mm-wave frequencies using a circular resonant cavity. The benefits of the new technique are that it is simple, low cost, capable of good accuracy and has the potential to work at high mm-wave frequencies.

METHODS FOR OBTAINING MULTIFREQUENCY LASING IN RESONANT CAVITY OF THE THZ LASER

2016 ◽  
Vol 75 (4) ◽  
pp. 355-361
Author(s):  
V. P. Radionov ◽  
P. K. Nesterov ◽  
V. K. Kiseliov
Keyword(s):  
Resonant Cavity

Usefulness of Foundry Tooling Materials in Microwave Heating Process

2013 ◽  
Vol 58 (3) ◽  
pp. 919-922 ◽  
Author(s):  
K. Granat ◽  
B. Opyd ◽  
D. Nowak ◽  
M. Stachowicz ◽  
G. Jaworski
Keyword(s):  
Electromagnetic Field ◽  
Microwave Heating ◽  
Loss Factor ◽  
Perturbation Technique ◽  
Resonant Cavity ◽  
Precise Determination ◽  
Heating Process ◽  
Basic Criterion ◽  
Measurement Results ◽  
Heating Technology

Abstract The paper describes preliminary examinations on establishing usefulness criteria of foundry tooling materials in the microwave heating technology. Presented are measurement results of permittivity and loss tangent that determine behaviour of the materials in electromagnetic field. The measurements were carried-out in a waveguide resonant cavity that permits precise determination the above-mentioned parameters by perturbation technique. Examined were five different materials designed for use in foundry tooling. Determined was the loss factor that permits evaluating usefulness of materials in microwave heating technology. It was demonstrated that the selected plastics meet the basic criterion that is transparency for electromagnetic radiation.

Determination of Niacin in Infant Formula by Solid-phase Clean-up and HPLC with Photodiode Array Detector

2009 ◽  
Vol 38 (3) ◽  
pp. 359-363
Author(s):  
Jee-Eun Hong ◽  
Mi-Ran Kim ◽  
Sang-Hee Cheon ◽  
Jung-Young Chai ◽  
Eun-Ryong Park ◽  
...  
Keyword(s):  
Infant Formula ◽  
Solid Phase ◽  
Array Detector ◽  
Photodiode Array Detector ◽  
Photodiode Array
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