scholarly journals Highly transparent microwave low-reflection coding metasurface by utilizing ultrathin silver films

2021 ◽  
Author(s):  
He yan Wang ◽  
Yujia Sun ◽  
Yilei Zhang ◽  
Bowen Luo ◽  
Zhibo Cao ◽  
...  
Keyword(s):  
Silver Films

“Preparation of Single Crystalline Gold Films for ED Studies”

1972 ◽  
Vol 30 ◽  
pp. 634-635
Author(s):  
Joseph D. C. Peng
Keyword(s):  
Crystal Morphology ◽  
Diffraction Theory ◽  
Scattering Matrix ◽  
Vacuum Evaporation ◽  
Gold Films ◽  
Matrix Formulation ◽  
Silver Films ◽  
Single Crystalline ◽  
Grating Pattern ◽  
Stacking Disorder

The relative intensities of the ED spots in a cross-grating pattern can be calculated using N-beam electron diffraction theory. The scattering matrix formulation of N-beam ED theory has been previously applied to imperfect microcrystals of gold containing stacking disorder (coherent twinning) in the (111) crystal plane. In the present experiment an effort has been made to grow single-crystalline, defect-free (111) gold films of a uniform and accurately know thickness using vacuum evaporation techniques. These represent stringent conditions to be met experimentally; however, if a meaningful comparison is to be made between theory and experiment, these factors must be carefully controlled. It is well-known that crystal morphology, perfection, and orientation each have pronounced effects on relative intensities in single crystals.The double evaporation method first suggested by Pashley was employed with some modifications. Oriented silver films of a thickness of about 1500Å were first grown by vacuum evaporation on freshly cleaved mica, with the substrate temperature at 285° C during evaporation with the deposition rate at 500-800Å/sec.

Mercury spreading on silver films: interface characteristics

1998 ◽  
Vol 77 (5) ◽  
pp. 1427-1436
Author(s):  
L. Kaplan, A. Shehter, Y. Lereah, H.Ta
Keyword(s):  
Silver Films ◽  
Interface Characteristics

Preparation of Conductive Silver Films from Electrophoretic Concentrates Stabilized with Sorbitan Monooleate and Sodium Bis(2-Ethylhexyl)Sulfosuccinate in n-Decane

2020 ◽  
Vol 82 (3) ◽  
pp. 295-302
Author(s):  
E. V. Poleeva ◽  
A. T. Arymbaeva ◽  
O. A. Bulavchenko ◽  
P. E. Plyusnin ◽  
M. G. Demidova ◽  
...  
Keyword(s):  
Sorbitan Monooleate ◽  
Silver Films

Optical Properties of Sputtered Silver Granular Films

2005 ◽  
Vol 480-481 ◽  
pp. 287-292 ◽  
Author(s):  
S.E. Paje ◽  
F. Teran ◽  
J.M. Riveiro ◽  
J. Llopis ◽  
M.A. García ◽  
...  
Keyword(s):  
Silver Nanoparticles ◽  
Optical Properties ◽  
Optical Absorption ◽  
Surface Morphology ◽  
Silver Clusters ◽  
Plasmon Excitation ◽  
Granular Films ◽  
Silver Films ◽  
Atomic Force ◽  
Atomic Force Micrographs

In this research we study optical absorption and morphology of silver films prepared with a sputtering method. Silver granular films are obtained on a glass substrate for films with thickness smaller than about 60 Å. Superficial silver clusters of around 100 nm in diameter are clearly seen in the atomic force micrographs. The absorption of these samples are characterized by plasmon excitation in the 450-650 nm spectral range, which differs from the known excitation of silver nanoparticles fabricated by different techniques. The optical absorption of silver granular films depend on sputtering conditions like substrate temperature or deposition rate and correlates with the surface morphology.

Auger analysis of thick silver films and of silver layers grown on copper

1981 ◽  
Vol 82 (2) ◽  
pp. 165-177 ◽  
Author(s):  
Y. Namba ◽  
R.W. Vook
Keyword(s):  
Auger Analysis ◽  
Silver Films

Silver Film Atomic Oxygen Sensors: Further Evidence for Utility as an Atmospheric Probe

1974 ◽  
Vol 52 (21) ◽  
pp. 2174-2175 ◽  
Author(s):  
W. R. Henderson
Keyword(s):  
Atomic Oxygen ◽  
Silver Film ◽  
Oxygen Sensors ◽  
Rate Of Change ◽  
Upper Atmosphere ◽  
Silver Films

Further evidence for the utility of thin silver films as detectors of atomic oxygen in the upper atmosphere is given. Measurements show that under prescribed conditions no correction for rate of oxidation or rate of change of oxidation is necessary.

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