scholarly journals Modeling of iterative time-reversed ultrasonically-encoded optical focusing in a reflection mode

2021 ◽  
Author(s):  
Jian Wang ◽  
Hanpeng Liang ◽  
Jiawei Luo ◽  
Ye Bolin ◽  
Yuecheng Shen
Keyword(s):  
Reflection Mode ◽  
Optical Focusing

scholarly journals Digital reflection-mode time-reversed ultrasonically encoded (TRUE) optical focusing

2014 ◽  
Author(s):  
Yuta Suzuki ◽  
Jian Wei Tay ◽  
Qiang Yang ◽  
Lihong Wang
Keyword(s):  
Reflection Mode ◽  
Optical Focusing

scholarly journals Reflection-mode time-reversed ultrasonically encoded optical focusing into turbid media

2011 ◽  
Vol 16 (8) ◽  
pp. 080505 ◽  
Author(s):  
Puxiang Lai ◽  
Xiao Xu ◽  
Honglin Liu ◽  
Yuta Suzuki ◽  
Lihong V. Wang
Keyword(s):  
Turbid Media ◽  
Reflection Mode ◽  
Optical Focusing

An improved design for an Scanning Tunnelling Microscope (STM) for use in a Transmission Electron Microscope (TEM)

1991 ◽  
Vol 49 ◽  
pp. 384-385
Author(s):  
W.K. Lo ◽  
J.C.H. Spence
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Mechanical Stability ◽  
Scanning Tunnelling Microscope ◽  
Reflection Mode ◽  
Specimen Holder ◽  
Transmission Electron ◽  
Scanning Tunnelling ◽  
Improved Design

An improved design for a combination Scanning Tunnelling Microscope/TEM specimen holder is presented. It is based on earlier versions which have been used to test the usefulness of such a device. As with the earlier versions, this holder is meant to replace the standard double-tilt specimen holder of an unmodified Philips 400T TEM. It allows the sample to be imaged simultaneously by both the STM and the TEM when the TEM is operated in the reflection mode (see figure 1).The resolution of a STM is determined by its tip radii as well as its stability. This places strict limitations on the mechanical stability of the tip with respect to the sample. In this STM the piezoelectric tube scanner is rigidly mounted inside the endcap of the STM holder. The tip coarse approach to the sample (z-direction) is provided by an Inchworm which is located outside the TEM vacuum.

A size reduced reflection-mode phase shifter

2005 ◽  
Vol 47 (5) ◽  
pp. 457-459 ◽  
Author(s):  
Kae-Oh Sun ◽  
Chih-Chuan Yen ◽  
Daniel van der Weide
Keyword(s):  
Phase Shifter ◽  
Reflection Mode

The Characterization of Defects in Silicon Carbide Crystals by X-Ray Topography in the Back-Reflection Geometry

2004 ◽  
Vol 230-232 ◽  
pp. 1-16 ◽  
Author(s):  
William M. Vetter
Keyword(s):  
Silicon Carbide ◽  
Computer Algorithms ◽  
Reflection Mode ◽  
X Ray ◽  
Back Reflection ◽  
Device Structures ◽  
Reflection Geometry ◽  
Grade Silicon ◽  
Favorable Conditions

Synchrotron white-beam x-ray topographs taken in the back-reflection mode have proved a powerful tool in the study of defects in semiconductor-grade silicon carbide crystals. Capable of mapping the distribution of axial dislocations across a wafer's area (notably the devastating micropipe defect), it can also provide information on their natures. Under favorable conditions, various other types of defect may be observed in back-reflection topographs of SiC, among which are subgrain boundaries, inclusions, and basal plane dislocations. Observed defect images in backreflection topographs may be simulated using relatively simple computer algorithms based on ray tracing. It has been possible to use back-reflection topographs of SiC substrates with device structures deposited upon them to relate the incidence of defects to device failure.

scholarly journals Reflection-mode in vivo photoacoustic microscopy with subwavelength lateral resolution

2014 ◽  
Vol 5 (12) ◽  
pp. 4235 ◽  
Author(s):  
Wei Song ◽  
Wei Zheng ◽  
Ruimin Liu ◽  
Riqiang Lin ◽  
Hongtao Huang ◽  
...  
Keyword(s):  
Lateral Resolution ◽  
Photoacoustic Microscopy ◽  
Reflection Mode
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