Simultaneous Reduction of Microwave Reflection and Infrared Emission Enabled by Phase Gradient Metasurface

Hybrid metasurfaces for microwave reflection and infrared emission reduction

Optics Express ◽

10.1364/oe.26.011950 ◽

2018 ◽

Vol 26 (9) ◽

pp. 11950 ◽

Cited By ~ 19

Author(s):

Yongqiang Pang ◽

Yongfeng Li ◽

Mingbao Yan ◽

Dongqing Liu ◽

Jiafu Wang ◽

...

Keyword(s):

Emission Reduction ◽

Infrared Emission ◽

Microwave Reflection

Download Full-text

Broadband Surface Waves Coupler with Low Infrared Emission and Microwave Reflection

Optics Express ◽

10.1364/oe.440078 ◽

2021 ◽

Author(s):

Tonghao Liu ◽

Yueyu Meng ◽

Hua Ma ◽

Ruichao Zhu ◽

Sining Huang ◽

...

Keyword(s):

Surface Waves ◽

Infrared Emission ◽

Microwave Reflection

Download Full-text

Detection and Characterization of earth-like Planets

International Astronomical Union Colloquium ◽

10.1017/s0252921100014810 ◽

1997 ◽

Vol 161 ◽

pp. 299-311 ◽

Cited By ~ 22

Author(s):

Jean Marie Mariotti ◽

Alain Léger ◽

Bertrand Mennesson ◽

Marc Ollivier

Keyword(s):

Direct Detection ◽

Contrast Ratio ◽

Angular Size ◽

Physical Nature ◽

Major Axis ◽

Infrared Emission ◽

Space Technology ◽

Semi Major Axis ◽

Earth Like Planets ◽

Visible Wavelengths

AbstractIndirect methods of detection of exo-planets (by radial velocity, astrometry, occultations,...) have revealed recently the first cases of exo-planets, and will in the near future expand our knowledge of these systems. They will provide statistical informations on the dynamical parameters: semi-major axis, eccentricities, inclinations,... But the physical nature of these planets will remain mostly unknown. Only for the larger ones (exo-Jupiters), an estimate of the mass will be accessible. To characterize in more details Earth-like exo-planets, direct detection (i.e., direct observation of photons from the planet) is required. This is a much more challenging observational program. The exo-planets are extremely faint with respect to their star: the contrast ratio is about 10−10at visible wavelengths. Also the angular size of the apparent orbit is small, typically 0.1 second of arc. While the first point calls for observations in the infrared (where the contrast goes up to 10−7) and with a coronograph, the latter implies using an interferometer. Several space projects combining these techniques have been recently proposed. They aim at surveying a few hundreds of nearby single solar-like stars in search for Earth-like planets, and at performing a low resolution spectroscopic analysis of their infrared emission in order to reveal the presence in the atmosphere of the planet of CO H2O and O3. The latter is a good tracer of the presence of oxygen which could be, like on our Earth, released by biological activity. Although extremely ambitious, these projects could be realized using space technology either already available or in development for others missions. They could be built and launched during the first decades on the next century.

Download Full-text

EXPERIMENTAL AND THEORETICAL STUDY ON THE INFRARED EMISSION OF SOOT PARTICLES IN LUMINOUS FLAME

10.1615/ihtc4.3770 ◽

1970 ◽

Cited By ~ 1

Author(s):

Takeshi Kunitomo ◽

Takashi Sato

Keyword(s):

Theoretical Study ◽

Infrared Emission ◽

Soot Particles

Download Full-text

Infrared Emission Spectroscopy as a Reliability Tool

ISTFA 1999: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa1999p0077 ◽

1999 ◽

Author(s):

Q. Kim ◽

S. Kayali

Keyword(s):

Spatial Resolution ◽

Emission Spectroscopy ◽

Hot Spot ◽

Cost Effective ◽

Infrared Emission ◽

Test System ◽

Operating Conditions ◽

Yield Enhancement ◽

Infrared Emission Spectroscopy ◽

Channel Temperature

Abstract In this paper, we report on a non-destructive technique, based on IR emission spectroscopy, for measuring the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET). A submicron-size He-Ne laser provides the local excitation of the gate channel and the emitted photons are collected by a spectrophotometer. Given the state of our experimental test system, we estimate a spectral resolution of approximately 0.1 Angstroms and a spatial resolution of approximately 0.9 μm, which is up to 100 times finer spatial resolution than can be obtained using the best available passive IR systems. The temperature resolution (<0.02 K/μm in our case) is dependent upon the spectrometer used and can be further improved. This novel technique can be used to estimate device lifetimes for critical applications and measure the channel temperature of devices under actual operating conditions. Another potential use is cost-effective prescreening for determining the 'hot spot' channel temperature of devices under normal operating conditions, which can further improve device design, yield enhancement, and reliable operation. Results are shown for both a powered and unpowered MESFET, demonstrating the strength of our infrared emission spectroscopy technique as a reliability tool.

Download Full-text

Failure Analysis of Short Faults on Advanced Wire-Bond and Flip-Chip Packages with Scanning SQUID Microscopy

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0073 ◽

2004 ◽

Author(s):

Steve K. Hsiung ◽

Kevan V. Tan ◽

Andrew J. Komrowski ◽

Daniel J. D. Sullivan ◽

Jan Gaudestad

Keyword(s):

Magnetic Fields ◽

Integrated Circuits ◽

Quantum Interference ◽

Flip Chip ◽

Infrared Emission ◽

Fault Analysis ◽

Wire Bond ◽

Overlay Design ◽

Scanning Squid ◽

Metal Layers

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.

Download Full-text