scholarly journals Determination of stress components in complex stress condition using micro-Raman spectroscopy

2021 ◽  
Author(s):  
Lulu Ma ◽  
Jiaxing Zheng ◽  
Xuejun Fan ◽  
Wei Qiu
Keyword(s):  
Raman Spectroscopy ◽  
Stress Condition ◽  
Complex Stress ◽  
Micro Raman Spectroscopy ◽  
Complex Stress Condition ◽  
Stress Components

Determination of acetaminophen spatial distribution and content in tablets using confocal micro-Raman spectroscopy mapping

2020 ◽  
Vol 22 (9) ◽  
Author(s):  
Hong-yu Jiang ◽  
Chang-hong Ding ◽  
Yue Wang ◽  
Ying-xin Zhang ◽  
Ahmed Mohammed ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Spatial Distribution ◽  
Micro Raman Spectroscopy

Determination of the doping concentration profile in Si δ-doped GaAs layers using micro-Raman spectroscopy of bevelled structures

2006 ◽  
Vol 497 (1-2) ◽  
pp. 7-15 ◽  
Author(s):  
R. Srnanek ◽  
J. Geurts ◽  
M. Lentze ◽  
G. Irmer ◽  
J. Kovac ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Concentration Profile ◽  
Doping Concentration ◽  
Micro Raman Spectroscopy

Determination of doping concentrations in very thin GaAs layers using micro-Raman spectroscopy on bevelled samples

Vacuum ◽  
2005 ◽  
Vol 80 (1-3) ◽  
pp. 20-23 ◽  
Author(s):  
R. Srnanek ◽  
M. Vesely ◽  
A. Vincze ◽  
M. Florovic ◽  
J. Kovac ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Micro Raman Spectroscopy

Determination of butanol distribution on salol-butanol crystals using Micro Raman Spectroscopy

2005 ◽  
Vol 16 (1-4) ◽  
pp. 104-106
Author(s):  
Taro Shimaoka ◽  
Hiroyuki Kagi ◽  
Makoto Natsuisaka ◽  
Satoshi Adachi ◽  
Yuko Inatomi
Keyword(s):  
Raman Spectroscopy ◽  
Micro Raman Spectroscopy

Residual Stresses in Tungsten Lines: Analysis of Experimental- (Micro-Raman Spectroscopy, Xrd) and Numerical Results

1995 ◽  
Vol 391 ◽  
Author(s):  
I. De Wolf ◽  
H.E. Maes ◽  
J. Moffet ◽  
M. Ignat
Keyword(s):  
Raman Spectroscopy ◽  
Residual Stresses ◽  
Theoretical Models ◽  
Numerical Results ◽  
Analytical Modelling ◽  
Experimental Techniques ◽  
Force Model ◽  
Micro Raman Spectroscopy ◽  
Stress Components ◽  
Edge Force

AbstractMicro-Raman spectroscopy, XRD, and analytical modelling are used to study stresses in and surrounding tungsten lines of different widths and spacing. The stress in the lines and in the adjacent substrate is calculated using a concentrated- and a distributed edge force model. Both models are adapted such that the substrate-stress components can also be calculated for an array of lines. The results from XRD and micro-Raman spectroscopy and the results from the distributed edge force model are in agreement. The combination of data from the two experimental techniques is shown to give some important feed-back to the theoretical models.

Sign in / Sign up

Export Citation Format

Share Document