scholarly journals Single-shot spectrally-resolved interferometry for the simultaneous measurement of the thickness and surface profile of multilayer films

2021 ◽  
Author(s):  
Young-Sik Ghim ◽  
Young Bum Seo ◽  
Ki-Nam Joo ◽  
Hyug-Gyo Rhee
Keyword(s):  
Simultaneous Measurement ◽  
Surface Profile ◽  
Multilayer Films ◽  
Single Shot ◽  
Spectrally Resolved

A single shot shearography device for simultaneous measurement in three shearing directions

2018 ◽  
Author(s):  
Armando Albertazzi Gonçalves ◽  
Estiven Sánchez ◽  
Analucia V. Fantin ◽  
Mauro E. Benedet ◽  
Daniel P. Willemann
Keyword(s):  
Simultaneous Measurement ◽  
Single Shot

Spectrally resolved polarizing interferometer for single-shot line profiling

2020 ◽  
Vol 59 (32) ◽  
pp. 10107
Author(s):  
Hyo Mi Park ◽  
Ui Hyeok Kwon ◽  
Young-Sik Ghim ◽  
Ki-Nam Joo
Keyword(s):  
Single Shot ◽  
Spectrally Resolved

scholarly journals Simultaneous Measurement of Film Thickness and Surface Profile of Film-covered Objects by Monochromatic Light Interferometry

2009 ◽  
Vol 45 (2) ◽  
pp. 73-82
Author(s):  
Hidemitsu OGAWA ◽  
Akihiro NAKANOWATARI ◽  
Katsuichi KITAGAWA ◽  
Masashi SUGIYAMA ◽  
Takuto NAITO
Keyword(s):  
Film Thickness ◽  
Simultaneous Measurement ◽  
Monochromatic Light ◽  
Surface Profile

Single-shot fs/ns rotational CARS for temporally and spectrally resolved gas-phase diagnostics

2020 ◽  
Author(s):  
Ali Hosseinnia ◽  
Maria Ruchkina ◽  
Pengji Ding ◽  
Joakim Bood ◽  
Per-Erik Bengtsson
Keyword(s):  
Gas Phase ◽  
Single Shot ◽  
Spectrally Resolved
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