All-optical serrodyne frequency shifter

Analysis of modulator-induced higher-order harmonics influence on flat and stable optical comb generation based on re-circulating frequency shifter for all-optical OFDM

10.1117/12.903990 ◽

2011 ◽

Author(s):

Lin Zhang ◽

Yingxiong Song ◽

Shujia Zhou ◽

Yingchun Li ◽

Jiajun Ye ◽

...

Keyword(s):

Higher Order ◽

Frequency Shifter ◽

All Optical ◽

Optical Ofdm ◽

Comb Generation

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All-optical generation of a 21 GHz microwave carrier by incorporating a double-Brillouin frequency shifter

Optics Letters ◽

10.1364/ol.35.001461 ◽

2010 ◽

Vol 35 (9) ◽

pp. 1461 ◽

Cited By ~ 17

Author(s):

Y. G. Shee ◽

M. A. Mahdi ◽

M. H. Al-Mansoori ◽

S. Yaakob ◽

R. Mohamed ◽

...

Keyword(s):

Frequency Shifter ◽

Optical Generation ◽

All Optical

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Analysis of modulator impact factors on flat and stable optical comb generation based on re-circulating frequency shifter for all-optical OFDM

IET International Communication Conference on Wireless Mobile and Computing (CCWMC 2011) ◽

10.1049/cp.2011.0911 ◽

2011 ◽

Author(s):

Yingchun Li ◽

Baojing Ni ◽

Yingxiong Song ◽

Lin Zhang ◽

Jiajun Ye ◽

...

Keyword(s):

Impact Factors ◽

Frequency Shifter ◽

All Optical ◽

Optical Ofdm ◽

Comb Generation

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All-Optical Frequency Shifter Based on Stimulated Brillouin Scattering in an Optical Fiber

IEEE Photonics Journal ◽

10.1109/jphot.2014.2312921 ◽

2014 ◽

Vol 6 (2) ◽

pp. 1-10 ◽

Cited By ~ 5

Author(s):

Erwin H. W. Chan ◽

Robert A. Minasian

Keyword(s):

Optical Fiber ◽

Brillouin Scattering ◽

Stimulated Brillouin Scattering ◽

Optical Frequency ◽

Frequency Shifter ◽

All Optical ◽

Stimulated Brillouin

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Analysis of modulator-induced higher-order harmonics influence on flat and stable optical comb generation based on re-circulating frequency shifter for all-optical OFDM

Optical Transmission Systems, Subsystems, and Technologies ◽

10.1364/acp.2011.83091k ◽

2011 ◽

Author(s):

Lin Zhang ◽

Yingxiong Song ◽

Shujia Zhou ◽

Yingchun Li ◽

Jiajun Ye ◽

...

Keyword(s):

Higher Order ◽

Frequency Shifter ◽

All Optical ◽

Optical Ofdm ◽

Comb Generation

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Correlation analysis of radiation damage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100108210 ◽

1978 ◽

Vol 36 (1) ◽

pp. 214-215

Author(s):

R. Hegerl ◽

A. Feltynowski ◽

B. Grill

Keyword(s):

Electron Microscopy ◽

Independent Random Variables ◽

Optical Parameters ◽

Bright Field Image ◽

Bright Field ◽

Expectation Value ◽

All Optical ◽

Image Element ◽

Stochastic Series ◽

The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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