Adaptive Optical Beam Alignment and Link Protection Switching for 5G-over-FSO

Development and applications of compact spectroscopic terahertz imaging systems using principles of optical beam engineering

10.15388/vu.thesis.115 ◽

2020 ◽

Author(s):

◽

Domas Jokubauskis

Keyword(s):

Terahertz Imaging ◽

Optical Beam ◽

Imaging Systems

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Electromagnetically Driven 2-axis Optical Beam Steering MEMS Mirror and Its Dependence of Actuation on Magnetic Field

IEEJ Transactions on Sensors and Micromachines ◽

10.1541/ieejsmas.130.107 ◽

2010 ◽

Vol 130 (4) ◽

pp. 107-112 ◽

Cited By ~ 7

Author(s):

Yoshiyuki Watanabe ◽

Yutaka Abe ◽

Shinnosuke Iwamatsu ◽

Seiya Kobayashi ◽

Yoshiyuki Takahashi ◽

...

Keyword(s):

Magnetic Field ◽

Beam Steering ◽

Optical Beam

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Comparison of Active and Passive Voltage Contrast for Failure Localization

ISTFA 2007: Conference Proceedings from the 33rd International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2007p0331 ◽

2007 ◽

Author(s):

R. Rosenkranz ◽

W. Werner

Keyword(s):

Case Studies ◽

Optical Beam ◽

Leakage Currents ◽

Localization Method ◽

Voltage Contrast ◽

Failure Localization

Abstract In many cases of failure localization, passive voltage contrast (PVC) localization method does not work, because it is not possible to charge up conducting structures which supposed to be dark in the SEM and FIB images. The reason for this is leakage currents. In this article, the authors show how they succeeded in overcoming these difficulties by the application of the active voltage contrast (AVC) method as it was described as biased voltage contrast by Campbell and Soden. They identified three main cases where the PVC didn't work but where they succeeded in failure localization with the AVC method. This is illustrated with the use of two case studies. Compared to the optical beam based methods the resolution is much better so a single failing contact of e.g. 70 nm technology can clearly be identified which cannot be done by TIVA or OBIRCH.

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