scholarly journals Robust silicon arbitrary ratio power splitters using shortcuts to adiabaticity

2020 ◽  
Vol 28 (7) ◽  
pp. 10350
Author(s):  
Hung-Ching Chung ◽  
Tai-Chun Wang ◽  
Yung-Jr Hung ◽  
Shuo-Yen Tseng
2020 ◽  
Vol 32 (18) ◽  
pp. 1187-1190
Author(s):  
Julian L. Pita Ruiz ◽  
Ivan Aldaya ◽  
Paulo Dainese ◽  
Lucas H. Gabrielli

1996 ◽  
Vol 32 (17) ◽  
pp. 1576 ◽  
Author(s):  
Q. Lai ◽  
M. Bachmann ◽  
W. Hunziker ◽  
P.A. Besse ◽  
H. Melchior

2005 ◽  
Vol 22 (10) ◽  
pp. 2595-2597
Author(s):  
Sun Yi-Ling ◽  
Jiang Xiao-Qing ◽  
Yang Jian-Yi ◽  
Wang Ming-Hua

Nanomaterials ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 1304
Author(s):  
Raquel Fernández de Cabo ◽  
David González-Andrade ◽  
Pavel Cheben ◽  
Aitor V. Velasco

Efficient power splitting is a fundamental functionality in silicon photonic integrated circuits, but state-of-the-art power-division architectures are hampered by limited operational bandwidth, high sensitivity to fabrication errors or large footprints. In particular, traditional Y-junction power splitters suffer from fundamental mode losses due to limited fabrication resolution near the junction tip. In order to circumvent this limitation, we propose a new type of high-performance Y-junction power splitter that incorporates subwavelength metamaterials. Full three-dimensional simulations show a fundamental mode excess loss below 0.1 dB in an ultra-broad bandwidth of 300 nm (1400–1700 nm) when optimized for a fabrication resolution of 50 nm, and under 0.3 dB in a 350 nm extended bandwidth (1350–1700 nm) for a 100 nm resolution. Moreover, analysis of fabrication tolerances shows robust operation for the fundamental mode to etching errors up to ± 20 nm. A proof-of-concept device provides an initial validation of its operation principle, showing experimental excess losses lower than 0.2 dB in a 195 nm bandwidth for the best-case resolution scenario (i.e., 50 nm).


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