scholarly journals Full-field X-ray fluorescence microscope based on total-reflection advanced Kirkpatrick–Baez mirror optics

2019 ◽  
Vol 27 (13) ◽  
pp. 18318 ◽  
Author(s):  
Satoshi Matsuyama ◽  
Jumpei Yamada ◽  
Yoshiki Kohmura ◽  
Makina Yabashi ◽  
Tetsuya Ishikawa ◽  
...  
Keyword(s):  
Total Reflection ◽  
Fluorescence Microscope ◽  
Full Field ◽  
X Ray

scholarly journals Development of achromatic full-field hard X-ray microscopy using four total-reflection mirrors

2013 ◽  
Vol 463 ◽  
pp. 012017 ◽  
Author(s):  
S Matsuyama ◽  
Y Emi ◽  
Y Kohmura ◽  
K Tamasaku ◽  
M Yabashi ◽  
...  
Keyword(s):  
Total Reflection ◽  
Full Field ◽  
X Ray

scholarly journals Achromatic and high-resolution full-field X-ray microscopy based on total-reflection mirrors

2015 ◽  
Vol 23 (8) ◽  
pp. 9746 ◽  
Author(s):  
Satoshi Matsuyama ◽  
Yoji Emi ◽  
Hidetoshi Kino ◽  
Yoshiki Kohmura ◽  
Makina Yabashi ◽  
...  
Keyword(s):  
High Resolution ◽  
Total Reflection ◽  
Full Field ◽  
X Ray

scholarly journals 50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Satoshi Matsuyama ◽  
Shuhei Yasuda ◽  
Jumpei Yamada ◽  
Hiromi Okada ◽  
Yoshiki Kohmura ◽  
...  
Keyword(s):  
Chromatic Aberration ◽  
Total Reflection ◽  
Full Field ◽  
X Ray ◽  
Reflection Imaging

Elemental analysis with a full-field X-ray fluorescence microscope and a CCD photon-counting system

2002 ◽  
Vol 9 (3) ◽  
pp. 128-131 ◽  
Author(s):  
Takuji Ohigashi ◽  
Norio Watanabe ◽  
Hiroki Yokosuka ◽  
Tatsuya Aota ◽  
Hidekazu Takano ◽  
...  
Keyword(s):  
Elemental Analysis ◽  
Photon Counting ◽  
Fluorescence Microscope ◽  
Counting System ◽  
Full Field ◽  
X Ray

Full-field X-ray fluorescence microscope with a quasi-monochromatic beam

2003 ◽  
Vol 104 ◽  
pp. 53-56 ◽  
Author(s):  
T. Ohigashi ◽  
N. Watanabe ◽  
H. Yokosuka ◽  
S. Aoki
Keyword(s):  
Fluorescence Microscope ◽  
Full Field ◽  
Monochromatic Beam ◽  
X Ray

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Determination of some heavy metals (Fe, Cu, Zn and Pb) in blood by total reflection X-ray fluorescence

2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Total Reflection ◽  
X Ray
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